EP1K10TC100-1N vs EP1K10TC100-3 Comparison
Detailed side-by-side comparison of EP1K10TC100-1N by Intel and EP1K10TC100-3 by Intel. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Specification Comparison
| Parameter | EP1K10TC100-1N | EP1K10TC100-3 |
|---|---|---|
| Brand | Intel | Intel |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Obsolete | Obsolete |
| Family | ACEX-1K | ACEX-1K |
| Series | EP1K10 | — |
| Logic Elements / Cells | 576 | — |
| Total Gates (typical) | 10,000 | — |
| Embedded RAM Bits | 12,288 bits | — |
| Logic Array Blocks (LABs) | 72 | — |
| Embedded Array Blocks (EABs) | 3 x 4 Kbit | — |
| User I/Os | 66 | — |
| Core Supply Voltage | 2.5 V (2.375 V to 2.625 V) | — |
| Operating Temperature | 0 °C to 70 °C (commercial) | [DATA_NEEDED: operating temperature grade] |
| Process Technology | 0.22 µm CMOS SRAM | 0.22 µm CMOS |
| Package | 100-pin TQFP (14 mm x 14 mm, 1 mm height) | 100-pin TQFP (TQFP-100) |
| Mounting Type | Surface Mount (gull-wing) | Surface Mount |
| Speed Grade | -1N (commercial, slower tier) | -3 (fastest commercial) |
| Configuration Method | SRAM (external PROM required) | — |
| JTAG Support | Yes (IEEE 1149.1 boundary-scan) | — |
| RoHS Status | Compliant | [DATA_NEEDED: RoHS status] |
| Number of Logic Elements (LEs) | — | 576 |
| Typical Gates | — | 10,000 |
| Number of LABs | — | 72 |
| Number of EABs | — | 3 |
| Total RAM Bits | — | 12,288 |
| User I/O Pins | — | 66 |
| Operating Frequency (max) | — | 200 MHz |
| Core Voltage | — | 2.5 V |
| Programming Interface | — | JTAG (IEEE 1149.1) |
| Supported I/O Standards | — | LVTTL, LVCMOS, PCI |
| Memory Configuration | — | Dual-port RAM supported (per family) |