EP4CE22F17C8N vs EP4CE22F17C7N Comparison
Detailed side-by-side comparison of EP4CE22F17C8N by Altera and EP4CE22F17C7N by Altera. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Specification Comparison
| Parameter | EP4CE22F17C8N | EP4CE22F17C7N |
|---|---|---|
| Brand | Altera | Altera |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Unknown | Active |
| Device Type | Cyclone IV E field-programmable gate array (FPGA) | — |
| Logic Elements | 22,320 logic elements | 22320 LEs |
| Maximum Frequency | 472.5 MHz | — |
| Input/Output Pins | 153 I/O pins | — |
| Embedded Memory Capacity | 608,256 bits | — |
| Memory Blocks | 1,395 blocks | — |
| Core Supply Voltage Range | 1.15 V to 1.25 V | — |
| Package | 256-pin fine-pitch ball grid array | 256-FBGA (17 x 17 mm, 1 mm pitch) |
| Package Family | F17 256-pin FBGA | — |
| Programmable Logic | 22,320-cell LUT-based FPGA | — |
| Mounting Type | Surface mount | Surface Mount |
| Operating Temperature Range | [DATA_NEEDED: operating temperature range] | — |
| Internal Memory Type | [DATA_NEEDED: embedded memory type] | — |
| Maximum I/O Data Rate | [DATA_NEEDED: maximum I/O data rate] | — |
| Number of PLL Blocks | [DATA_NEEDED: PLL count] | — |
| Configuration Interface | [DATA_NEEDED: configuration interface] | — |
| RoHS Status | [DATA_NEEDED: RoHS status] | — |
| REACH Status | [DATA_NEEDED: REACH status] | — |
| Family | — | Cyclone IV E |
| Embedded Memory | — | 608256 bits |
| User I/O | — | 153 |
| Maximum Operating Frequency | — | 472.5 MHz |
| Core Supply Voltage | — | 1.15 V to 1.25 V |
| Speed Grade | — | 7 (C7) |
| Operating Temperature | — | 0C to +85C (commercial) |
| Configuration Modes | — | JTAG, Active Serial, Passive Serial |
| PLLs | — | 4 |
| Lead Free | — | Yes (lead-free suffix N) |
| Halogen Free | — | Compliant |
| ECCN | — | EAR99 |
| Country of Origin | — | Republic of Korea |
| Introduction Date | — | January 27, 2010 |