MT25QL01GBBB8E12-0AUT vs MT25QU01GBBB8E12-0AUT Comparison
Detailed side-by-side comparison of MT25QL01GBBB8E12-0AUT by Micron Technology and MT25QU01GBBB8E12-0AUT by Micron Technology. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Micron Technology
MT25QL01GBBB8E12-0AUT - 1Gb SPI NOR Flash 133MHz | Micron
MT25QL01GBBB8E12-0AUT ✓ ActiveMicron Technology
MT25QU01GBBB8E12-0AUT - 1Gb SPI NOR Flash 133MHz | Micron
MT25QU01GBBB8E12-0AUT ✓ ActiveSpecification Comparison
| Parameter | MT25QL01GBBB8E12-0AUT | MT25QU01GBBB8E12-0AUT |
|---|---|---|
| Brand | Micron Technology | Micron Technology |
| Category | EEPROM | Memory ICs |
| Lifecycle Status | Active | Active |
| Stock Status | In Stock | In Stock |
| Unit Price (USD) | $4.65 | $7.10 |
| Memory Type | NOR Flash - Serial SPI | NOR Flash, Serial (SPI) |
| Density | 1 Gbit (128 MB) | 1 Gbit (128 MB) |
| Organization | 256M x4 (DDP) | x1 / x2 / x4 (I/O width) |
| Supply Voltage | 2.7 V to 3.6 V (3 V class) | 1.8 V |
| Max Clock Frequency | 133 MHz | 133 MHz |
| Interface | SPI - Single/Dual/Quad I/O | SPI, Dual SPI, Quad SPI |
| Sector Erase Sizes | 4 KB / 32 KB / 64 KB | — |
| Operating Temperature | -40C to +125C | -40C to +125C |
| Package | 24-T-PBGA (6x8 mm) | 24-T-PBGA (6x8 mm) |
| FBGA Code | RW319 | RW320 |
| Mounting Type | Surface Mount (BGA reflow) | Surface Mount |
| Addressing | 3-byte / 4-byte extended address | — |
| XIP Support | Yes (execute-in-place) | — |
| Write Protection | Advanced write protection mechanisms | Hardware write protection; Software write protection; Write enable latch |
| AEC-Q100 | Qualified (automotive, -0AUT suffix) | — |
| RoHS Status | Compliant | [DATA_NEEDED: RoHS status] |
| SLC Cell Type | SLC NOR | — |
| Access Time | — | 6 ns |
| Automotive Qualification | — | AEC-Q100 qualified |
| Product Longevity Program | — | No |
| MSL Level | — | [DATA_NEEDED: MSL level] |
| Program/Erase Endurance | — | [DATA_NEEDED: endurance cycles] |
| Data Retention | — | [DATA_NEEDED: retention years] |