NAFE33352-EVB - Universal AIO-AFE Eval Board | NXP | Industrial
MPN: NAFE33352-EVB β Active| Qty | Unit Price | Extended |
|---|---|---|
| 1 | $0 | $0.00 |
| 10 | $0 | $0.00 |
| 100 | $0 | $0.00 |
| 500 | $0 | $0.00 |
| 1,000 | $0 | $0.00 |
NAFE33352-EVB Overview
An analog front-end (AFE) is the circuit stage that conditions real-world signals - voltages, currents, and resistive sensor outputs - before conversion to the digital domain. Within the signal-chain hierarchy (sensor -> AFE -> ADC/DAC -> MCU), the NAFE33352 collapses multiple discrete functions into one IC: a 14/16/18-bit DAC, a 16/24-bit ADC, a low-drift reference, buffers, and high-voltage capable I/O. The NAFEx3352 family features one analog input/output channel and two universal input channels, making it a universal AIO-AFE.
The EVB pairs the NAFE33352 device with access points for the HVQFN-40 (6 mm x 6 mm) package signals, and works with the NXP graphical user interface described in user manual UM12180. When combined with an LPC54S018 MCU board loaded with custom firmware (offered separately as KITNAFE33352-EVB), the GUI can read back the part number and OTP register contents, configure channels in software, and stream measurement data.
Typical use cases include evaluating RTD and thermistor temperature measurement (using current output plus voltage input to measure resistance), 4-20 mA style current-output loops, process-control analog I/O, and condition monitoring via the LVMUX path that digitizes external and internal signals.
A key design consideration: the same EVB hardware is used for both NAFE33352 and NAFE93352 variants, differing only in the assembled device, so verify the populated device when interpreting measurements.
This page synthesizes distributor availability, board-level alternatives, and practical evaluation guidance not consolidated in the NXP datasheet or user manual.
Drop-in alternatives for NAFE33352-EVB β same package, pin-to-pin compatible. Different-package parts requiring PCB rework are excluded.
Variants in this series
Same-series models that are drop-in compatible with NAFE33352-EVB (same form factor and footprint) β differing in Product Type, Target Device.
Quick Comparison Tool β Select alternative parts for side-by-side comparison:
KITNAFE33352-EVB
β Drop-Inπ Reference alternative (not in catalog)
NAFE33352-UIOM
β Drop-Inβ In Stock
Contact for price
View Datasheet βNAFE93352-EVB
β Drop-Inβ In Stock
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View Datasheet βNAFE33352-EVB Specifications (manufacturer-published)
| Product Type | Evaluation Board |
| Target Device | NAFE33352 (software-configurable universal AIO-AFE) |
| ADC Resolution | 16/24-bit |
| DAC Resolution | 14/16/18-bit (device dependent) |
| Analog Channels | 1 analog input/output channel + 2 universal input channels |
| Device Package | HVQFN-40 (6 mm x 6 mm) |
| Compatible MCU Board | LPC54S018EVB (with custom firmware) |
| Bundle Version | KITNAFE33352-EVB (EVB + LPC54S018 MCU board) |
| Companion AFE | NAFE33350 (analog output AFE, evaluable per NXP) |
| Readback Paths | Vsense, Isense, LVMUX to ADC |
| Measurement Capability | Voltage, current, resistance (RTD/thermistor) measurement |
| Board Manual | UM12180 NAFEx3352 Evaluation Board User Manual |
| Intended Market | Industrial-grade measurement and control |
NAFE33352-EVB Interfaces & Connectors
NAFE33352-EVB exposes the following interfaces and connectors as published by the manufacturer: Expansion / Buses. Expansion header pinout, connector pin numbering, and electrical limits are defined in the manufacturer documentation.
| Expansion / Buses | 16/24-bit |
Refer to the manufacturer documentation for the full expansion header pinout and connector pin numbering.
Typical Applications
NAFE33352-EVB is suitable for 6 applications: Industrial Process Control Analog I/O Evaluation, RTD and Thermistor Temperature Measurement, Condition Monitoring via LVMUX, Analog Output Loop and Actuator Drive Prototyping, Arduino-Based AFE Integration and Maker Prototyping, Test and Measurement Instrumentation Development.
Industrial Process Control Analog I/O Evaluation
The NAFE33352-EVB lets process-control engineers validate analog I/O designs before production. The NAFE33352's software-configurable universal AIO architecture integrates a 16/24-bit ADC and a 14/16/18-bit DAC with a low-drift reference, so voltage and current loop ranges can be reconfigured in the GUI without hardware changes. On the EVB, engineers exercise the current-output path with Isense readback to verify loop accuracy, and use Vsense to confirm load regulation under realistic burden conditions. Because NXP states the AFE meets high-precision industrial-grade requirements, measured bench results transfer directly to the final NAFE33352B40BSE design. Typical work includes characterizing output settling, gain error, and drift across the industrial temperature range prior to layout commitment.
Recommended
RTD and Thermistor Temperature Measurement
The NAFE33352-EVB is purpose-suited for resistive sensor prototyping because the NAFE33352 combines current output and voltage input to measure resistance and temperature using RTDs or thermistors, per NXP documentation. On the board, the DAC-driven current source excites the sensor, the 24-bit ADC digitizes the resulting voltage, and the low-offset-drift buffers plus low-drift voltage reference limit excitation and gain errors that would otherwise corrupt small resistance changes. The GUI automates configuration so engineers can compare 2-wire, 3-wire, and 4-wire connection schemes quickly and quantify ratiometric benefits. Validated excitation levels and conversion settings then carry directly into firmware for the production IC.
Recommended
Condition Monitoring via LVMUX
For industrial condition-monitoring nodes, the NAFE33352-EVB demonstrates how one AFE can digitize multiple auxiliary signals through its LVMUX connection to the ADC. NXP documentation notes the LVMUX path digitizes external and internal signals for condition monitoring, letting a single 16/24-bit ADC serve sensor diagnostics alongside the primary measurement channel. On the EVB, engineers connect representative sensor outputs to the mux inputs, sweep mux settings in software, and assess cross-talk, settling time, and effective resolution per channel. This validates whether a multi-channel monitoring architecture can share one converter instead of multiple discrete ADCs, reducing BOM cost and board area in dense industrial installations such as motor drives and pump skids.
Recommended
Analog Output Loop and Actuator Drive Prototyping
The EVB supports prototyping of current- and voltage-output actuator interfaces built on the NAFE33352's precision DAC. With 14/16/18-bit DAC resolution available in the device family, the output path can generate fine-grained setpoints for valve positioners, variable-frequency drive references, and transmitter outputs. The board's Isense readback closes the verification loop: engineers command an output, measure what actually flows, and quantify compliance-headroom and load-dependence errors in the GUI. Because the AFE includes high-voltage-capable I/O per NXP's family description, higher-compliance output stages can be exercised on the board within datasheet limits. Results establish the calibration and safety limits needed before the design moves to the production IC.
Recommended
Arduino-Based AFE Integration and Maker Prototyping
For rapid prototyping outside traditional industrial tooling, NXP offers the NAFE33352-UIOM Universal AIO AFE Arduino Shield evaluation board hosting the same NAFE33352 device. Engineers who prefer microcontroller ecosystems can validate channel configurations on the shield, then port register settings to the EVB or directly to the IC. The NAFE33352's software configurability means the same digital setup produces the same analog behavior across all platforms, so shield-based experiments remain representative. This path suits IoT edge nodes, test jigs, and university labs where Arduino compatibility shortens bring-up time. The 16/24-bit ADC precision and low-drift reference still deliver industrial-class measurement quality in a hobby-friendly form factor.
Recommended
Test and Measurement Instrumentation Development
Bench-instrument developers use the NAFE33352-EVB to qualify an AFE for data-acquisition and measurement products. The 16/24-bit ADC with low-offset-drift buffers supports the resolution targets typical of industrial DMM and DAQ front-ends, while the readback paths (Vsense, Isense) provide self-test hooks that instrument firmware can exploit for periodic calibration checks. On the EVB, engineers characterize noise floor, linearity, and reference drift under controlled conditions and compare against discrete multi-chip front-end alternatives. Because the AFE integrates the reference and buffers, board-level error budgeting is simplified, and the GUI captures the statistical evidence needed for design reviews. Validated settings transfer directly to the production NAFE33352B40BSE.
Recommended
Recommended Products Summary
Engineering reference data for NAFE33352-EVB β comparison, design guidance, and compliance information.
Selection Guide
Comparison with Alternatives
| Parameter | This Product | KITNAFE33352-EVB | NAFE33352-UIOM | NAFE93352-EVB |
|---|---|---|---|---|
| Package / Form Factor | Standalone evaluation board (NAFE33352-EVB) | EVB + LPC54S018 MCU board bundle | Arduino shield evaluation board | Same EVB hardware, NAFE93352 device assembled |
| Brand | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors | NXP Semiconductors |
| Assembled AFE Device | NAFE33352 | NAFE33352 | NAFE33352 | NAFE93352 |
| MCU Host Included | No (LPC54S018EVB purchased separately) | Yes (LPC54S018 board with custom firmware) | No (host Arduino board required) | No (LPC54S018EVB purchased separately) |
| Form Factor Suitable for Arduino Stacking | No | No | Yes (Arduino shield) | No |
| Lifecycle Status | Active | Active | Active | Active |
Key Differentiators
- Complete GUI platform when bundled with MCU (vs NAFE33352-EVB (this product, standalone))
- Arduino ecosystem compatibility (vs KITNAFE33352-EVB)
- Device-family flexibility on identical hardware (vs NAFE93352-EVB)
Design Notes
Verify which device is actually assembled before trusting measurements. Per NXP user manual UM12180, the same EVB hardware ships as NAFE33352-EVB or NAFE93352-EVB, differing only in the populated device, and the GUI reads back the OTP register to identify the part. In the absence of proper power to both the LPC MCU board and the EVB, the GUI cannot read back the MCU board address or the NAFE part number, so a failed readback should be treated as a power/harness problem first, not a device failure.
Use the documented LPC54S018EVB power-up sequence when running GUI-based evaluation: the MCU board must be powered before or simultaneously with the NAFEx3352 EVB for the GUI to enumerate the platform. For standalone bench evaluation, apply the device supplies within NAFE33352 datasheet limits and allow the low-drift reference to settle before recording precision measurements; reference warm-up dominates short-term drift in the first minutes after power-on. Confirm exact supply rails and sequencing requirements in the NAFE33352 datasheet and UM12180 before first power-up.
When evaluating sub-LSB performance of the 16/24-bit ADC, keep external signal leads short and use a solid ground return for sensor excitation currents. The NAFE33352's current-output path for RTD measurement can inject noise into nearby high-impedance voltage inputs if routing on the bench is loose. Twisted-pair or shielded cabling to the sensor, plus star grounding at the EVB input terminal, preserves the low-offset-drift buffer accuracy that NXP designed into the AFE. Reserve the LVMUX inputs for genuinely slow diagnostic signals to avoid mux-settling artifacts in the main measurement record.
Compliance Information
Compliance data for the evaluation board was not present in the provided web data. The NAFE33352 IC datasheet should be consulted for device-level compliance statements; board-level certificates are typically available from NXP on request.
