MT25QL512ABB8E12-0AUT vs MT25QL128ABB8E12-CAUT Comparison
Detailed side-by-side comparison of MT25QL512ABB8E12-0AUT by Micron Technology and MT25QL128ABB8E12-CAUT by Micron Technology. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Micron Technology
MT25QL512ABB8E12-0AUT - 512Mb SPI NOR Flash 133MHz | Micron
MT25QL512ABB8E12-0AUT ✓ ActiveMicron Technology
MT25QL128ABB8E12-CAUT - 128Mb SPI Quad I/O NOR Flash | Micron
MT25QL128ABB8E12-CAUT ✓ ActiveSpecification Comparison
| Parameter | MT25QL512ABB8E12-0AUT | MT25QL128ABB8E12-CAUT |
|---|---|---|
| Brand | Micron Technology | Micron Technology |
| Category | Memory ICs | Memory ICs |
| Lifecycle Status | Active | Active |
| Stock Status | In Stock | In Stock |
| Unit Price (USD) | $10.55 | $3.60 |
| Memory Type | NOR Flash, Serial | Flash - NOR Memory IC |
| Density | 512 Mbit (64 MB) | — |
| Interface | SPI - Quad I/O | SPI - Quad I/O |
| Maximum Clock Frequency | 133 MHz | — |
| Supply Voltage | 3 V class | 2.7 V to 3.6 V (3V class) |
| Operating Temperature | -40C and above (AUT automotive option) | -40C to +125C (automotive grade, CAUT suffix) |
| Family | MT25Q | — |
| FBGA Code | RW300 | — |
| Package | 24-T-PBGA (6x8 mm) | 24-T-PBGA (6x8 mm) |
| Erase Granularity | 4KB, 32KB, 64KB sector erase | — |
| Protocols Supported | SPI, Dual SPI, Quad SPI | — |
| Mounting Type | Surface Mount | Surface Mount |
| XIP Support | eXecute-In-Place capable | — |
| Temperature Grade | Automotive (AUT) | — |
| RoHS Status | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS compliance statement] |
| MSL Level | [DATA_NEEDED: moisture sensitivity level] | — |
| Memory Capacity | — | 128 Mbit (16 MB) |
| Max Clock Frequency | — | 133 MHz |
| Access Time | — | 5 ns |
| Memory Organization | — | x1 / x2 / x4 |
| Series | — | MT25Q (successor to N25Q) |
| FBGA Code (family variant) | — | RW314 (MT25QL128ABB1EW7-CAUT per datasheet addendum) |
| Programming/Endurance | — | [DATA_NEEDED: program/erase endurance cycles] |
| Data Retention | — | [DATA_NEEDED: data retention years] |
| Active Read Current | — | [DATA_NEEDED: ICC read current] |
| Standby Current | — | [DATA_NEEDED: ICC standby current] |
| Product Longevity Program | — | No (per datasheet addendum) |