MT25QL512ABB8E12-0AUT vs MT25QL128ABB8E12-CAUT Vergleich
Detaillierter Direktvergleich von MT25QL512ABB8E12-0AUT von Micron Technology und MT25QL128ABB8E12-CAUT von Micron Technology. Vergleichen Sie die wichtigsten Spezifikationen, elektrischen Parameter, Gehäuse, Lebenszyklusstatus, Preise und Verfügbarkeit, um das beste Bauteil für Ihre Designanforderungen zu ermitteln.
Micron Technology
MT25QL512ABB8E12-0AUT - 512Mb SPI NOR Flash 133MHz | Micron
MT25QL512ABB8E12-0AUT ✓ AktivMicron Technology
MT25QL128ABB8E12-CAUT - 128Mb SPI Quad I/O NOR Flash | Micron
MT25QL128ABB8E12-CAUT ✓ AktivSpezifikationsvergleich
| Parameter | MT25QL512ABB8E12-0AUT | MT25QL128ABB8E12-CAUT |
|---|---|---|
| Marke | Micron Technology | Micron Technology |
| Kategorie | Memory ICs | Memory ICs |
| Lebenszyklusstatus | Aktiv | Aktiv |
| Lagerstatus | In Stock | In Stock |
| Stückpreis (USD) | $10,55 | $3,60 |
| Speichertyp | NOR Flash, Serial | Flash - NOR Memory IC |
| Density | 512 Mbit (64 MB) | — |
| Schnittstelle | SPI - Quad I/O | SPI - Quad I/O |
| Maximale Taktfrequenz | 133 MHz | — |
| Versorgungsspannung | 3 V class | 2.7 V to 3.6 V (3V class) |
| Betriebstemperatur | -40C and above (AUT automotive option) | -40C to +125C (automotive grade, CAUT suffix) |
| Family | MT25Q | — |
| FBGA Code | RW300 | — |
| Gehäuse | 24-T-PBGA (6x8 mm) | 24-T-PBGA (6x8 mm) |
| Erase Granularity | 4KB, 32KB, 64KB sector erase | — |
| Protocols Supported | SPI, Dual SPI, Quad SPI | — |
| Montageart | Surface Mount | Surface Mount |
| XIP Support | eXecute-In-Place capable | — |
| Temperature Grade | Automotive (AUT) | — |
| RoHS-Status | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS compliance statement] |
| MSL-Level | [DATA_NEEDED: moisture sensitivity level] | — |
| Memory Capacity | — | 128 Mbit (16 MB) |
| Max Clock Frequency | — | 133 MHz |
| Access Time | — | 5 ns |
| Memory Organization | — | x1 / x2 / x4 |
| Series | — | MT25Q (successor to N25Q) |
| FBGA Code (family variant) | — | RW314 (MT25QL128ABB1EW7-CAUT per datasheet addendum) |
| Programming/Endurance | — | [DATA_NEEDED: program/erase endurance cycles] |
| Data Retention | — | [DATA_NEEDED: data retention years] |
| Active Read Current | — | [DATA_NEEDED: ICC read current] |
| Standby Current | — | [DATA_NEEDED: ICC standby current] |
| Product Longevity Program | — | No (per datasheet addendum) |