RTAX250S-CG624E vs RTAX250S-CG624EV Comparison
Detailed side-by-side comparison of RTAX250S-CG624E by Microchip Technology and RTAX250S-CG624EV by Microchip Technology. Compare key specifications, electrical parameters, packaging, lifecycle status, pricing, and availability to determine the best component for your design requirements.
Microchip Technology
RTAX250S-CG624E - 250K-Gate Rad-Tolerant FPGA | Microchip
RTAX250S-CG624E ✓ ActiveMicrochip Technology
RTAX250S-CG624EV - 250K-Gate Rad-Tolerant FPGA | Microchip
RTAX250S-CG624EV ✓ ActiveSpecification Comparison
| Parameter | RTAX250S-CG624E | RTAX250S-CG624EV |
|---|---|---|
| Brand | Microchip Technology | Microchip Technology |
| Category | FPGA & CPLD | FPGA & CPLD |
| Lifecycle Status | Active | Active |
| Stock Status | In Stock | In Stock |
| Unit Price (USD) | $0.00 | $0.00 |
| System Gates | 250000 gates | 250000 gates |
| Logic Cells (CLBs) | 2816 | — |
| Maximum Toggle Frequency | 649 MHz | — |
| Process Technology | 0.15 um CMOS | 0.15 um CMOS |
| Core Supply Voltage | 1.5 V | 1.5 V |
| Logic Family | CMOS | CMOS |
| CLB Combinatorial Delay (max) | 0.930 ns | — |
| Package Type | CCGA-624 (ceramic column grid array, 624 pins) | 624-pin Ceramic Grid Array (CGA/CCGA) |
| Operating Temperature | -55C to +125C | -55C to +125C |
| Programming Technology | Antifuse (one-time programmable) | — |
| SEU Hardening | SEU-hardened registers, no external TMR required | — |
| SEU Immunity | Immune to single-event upsets to specified LET threshold; SEU rate < 10-10 errors/bit-day | [DATA_NEEDED: LET threshold (MeV-cm2/mg)] |
| Power-Up Behavior | Live at power-up (true single-chip) | — |
| Family | RTAX-S radiation-tolerant FPGA | RTAX-S RadTolerant FPGA |
| Mounting Type | Surface Mount | Surface Mount (ceramic column grid array) |
| Target Application | Space-flight systems | — |
| Logic Cells | — | 4224 cells |
| Configurable Logic Blocks (CLBs) | — | 2816 |
| Maximum Clock Frequency | — | 649 MHz |
| Pin Count | — | 624 |
| Radiation Tolerance | — | SEU-hardened registers; SEU rate < 10-10 errors per bit-day |
| Configuration | — | Anti-fuse, live-at-power-up, single chip |
| RoHS Status | — | [DATA_NEEDED: RoHS status] |