EP1C12Q240C8N vs EP1C12Q240I8ES Vergleich

Detaillierter Direktvergleich von EP1C12Q240C8N von Intel und EP1C12Q240I8ES von Intel. Vergleichen Sie die wichtigsten Spezifikationen, elektrischen Parameter, Gehäuse, Lebenszyklusstatus, Preise und Verfügbarkeit, um das beste Bauteil für Ihre Designanforderungen zu ermitteln.

Spezifikationsvergleich

Parameter EP1C12Q240C8N EP1C12Q240I8ES
Marke Intel Intel
Kategorie FPGA & CPLD FPGA & CPLD
Lebenszyklusstatus Obsolete Obsolete
Lagerstatus In Stock In Stock
Stückpreis (USD) $24,80 $7,15
Series Cyclone —
Family Cyclone I —
Logic Elements (LE) 12,060 —
Total RAM Bits 239,616 —
Embedded RAM Blocks M4K (4 Kbit blocks) —
Process Technology 0.13 µm all-layer copper SRAM —
Core Voltage 1.5 V —
Speed Grade 8 (commercial) 8
User I/O Pins (max in package) 173 —
Gehäuse 240-pin PQFP / BFQFP (Q240) —
PLLs 2 —
Global Clock Networks 8 —
Configuration Modes AS, PS, JTAG —
Betriebstemperatur Commercial (0C to +85C) —
Montageart Surface Mount —
RoHS-Status [DATA_NEEDED: RoHS status - not stated in verified data] unknown
Lead-Free [DATA_NEEDED: lead-free status - not stated in verified data] —
Manufacturer — Intel
Manufacturer Part Number — EP1C12Q240I8ES
FPGA Family — Cyclone
Programmable Logic Type — FPGA (field-programmable gate array)
Configuration Type — SRAM-based
FPGA Process — 1.5-V, 0.13-um, all-layer copper SRAM process
Maximum Family Logic Elements — 20,060 LEs
Maximum Family Embedded RAM — 288 Kbits
EP1C12 Delivered Logic Elements — [DATA_NEEDED: EP1C12 exact LE count]
Package Code — FQFP
Package Description — 240-pin square QFP (PQFP/FQFP)
Number of Terminals — 240
Terminal Form — GULL WING
Package Shape — Square
JESD-609 Code — e0
Maximum Supply Voltage — 1.575 V
Nominal Core Supply Voltage — 1.5 V
Temperature Grade Code — I (industrial)
Ordering Code Variant — ES (engineering sample)
Minimum Operating Temperature — [DATA_NEEDED: minimum operating temperature]
Maximum Operating Temperature — [DATA_NEEDED: maximum operating temperature]
Supported Configuration — Configuration and JTAG boundary-scan testing supported

Datenblätter & Ressourcen

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