EP1K100FC484-1 vs EP1K100FC484-3N Vergleich
Detaillierter Direktvergleich von EP1K100FC484-1 von Intel und EP1K100FC484-3N von Intel. Vergleichen Sie die wichtigsten Spezifikationen, elektrischen Parameter, Gehäuse, Lebenszyklusstatus, Preise und Verfügbarkeit, um das beste Bauteil für Ihre Designanforderungen zu ermitteln.
Intel
EP1K100FC484-1 - 100K Gate ACEX-1K FPGA, 484-BGA, 333MHz | Intel / Altera
EP1K100FC484-1 ObsoleteIntel
EP1K100FC484-3N - 100K-Gate ACEX 1K FPGA, 484-BGA | Intel
EP1K100FC484-3N ⚠ Letzte BestellmöglichkeitSpezifikationsvergleich
| Parameter | EP1K100FC484-1 | EP1K100FC484-3N |
|---|---|---|
| Marke | Intel | Intel |
| Kategorie | FPGA & CPLD | FPGA & CPLD |
| Lebenszyklusstatus | Obsolete | Letzte Kaufgelegenheit |
| Lagerstatus | In Stock | In Stock |
| Stückpreis (USD) | $52,10 | $65,10 |
| Family | ACEX-1K | ACEX 1K |
| Logic Elements (LEs) | 4,992 | — |
| Equivalent Gates | 100,000 | — |
| Embedded Memory (Bits) | 49,152 | — |
| Embedded Array Blocks (EABs) | 6 | 12 |
| Logic Array Blocks (LABs) | 624 | 624 |
| Maximum User I/O Pins | 333 | — |
| Maximum Operating Frequency | 333.33 MHz | — |
| Process Technology | 0.22 µm CMOS | 0.22 µm CMOS |
| Core Supply Voltage (VCCINT) | 2.5 V | — |
| I/O Supply Voltage (VCCIO) | 2.5 V to 3.3 V | — |
| Gehäuse | 484-ball FBGA (FC484), 23 x 23 mm | 484-ball FBGA |
| Speed Grade | -1 (commercial) | -3 |
| Programming Interface | IEEE 1149.1 JTAG, serial Passive Serial | — |
| Betriebstemperatur | 0°C to +70°C (commercial) | — |
| Montageart | Surface Mount (BGA) | Surface Mount |
| RoHS-Status | Non-compliant (original SnPb ball version) | [DATA_NEEDED: RoHS status] |
| Logic Elements | — | 4,992 |
| Typical Gate Count | — | 100,000 gates |
| Total RAM Bits | — | 49,152 |
| User I/Os | — | 333 |
| Operating Voltage (VCCINT) | — | 2.5 V |
| Internal Operating Frequency | — | up to 200 MHz |
| Configuration Method | — | Passive Serial, JTAG, PPA |
| I/O Standards Supported | — | LVTTL, LVCMOS, PCI, 2.5V/3.3V/5V multiVolt I/O |
| Operating Temperature (Commercial) | — | 0 °C to +70 °C |
| Boundary-Scan Test | — | IEEE 1149.1 (JTAG) |