EP1K100FI484-2N vs EP1K100FC484-3N Vergleich
Detaillierter Direktvergleich von EP1K100FI484-2N von Intel und EP1K100FC484-3N von Intel. Vergleichen Sie die wichtigsten Spezifikationen, elektrischen Parameter, Gehäuse, Lebenszyklusstatus, Preise und Verfügbarkeit, um das beste Bauteil für Ihre Designanforderungen zu ermitteln.
Intel
EP1K100FC484-3N - 100K-Gate ACEX 1K FPGA, 484-BGA | Intel
EP1K100FC484-3N ⚠ Letzte BestellmöglichkeitSpezifikationsvergleich
| Parameter | EP1K100FI484-2N | EP1K100FC484-3N |
|---|---|---|
| Marke | Intel | Intel |
| Kategorie | FPGA & CPLD | FPGA & CPLD |
| Lebenszyklusstatus | Obsolete | Letzte Kaufgelegenheit |
| Lagerstatus | In Stock | In Stock |
| Stückpreis (USD) | $65,00 | $65,10 |
| Series | ACEX-1K | — |
| Manufacturer | Intel (formerly Altera) | — |
| Logic Elements / Cells | 4,992 | — |
| Total RAM Bits | 49,152 | 49,152 |
| Number of Gates | 257,000 (typical 100,000) | — |
| Number of Logic Array Blocks (LABs) | 624 | — |
| Number of I/O | 333 | — |
| Number of Embedded Array Blocks (EABs) | 12 | — |
| Supply Voltage - Core (VCCINT) | 2.375 V to 2.625 V (2.5 V nominal) | — |
| Betriebstemperatur | -40C to +85C (Industrial) | — |
| Speed Grade | -2 | -3 |
| Montageart | Surface Mount | Surface Mount |
| Gehäuse / Bauform | 484-FBGA (FineLine BGA, 23 mm x 23 mm) | — |
| Supplier Device Package | 484-FBGA | — |
| Configuration Method | SRAM - Serial / JTAG | Passive Serial, JTAG, PPA |
| RoHS-Status | non_compliant (contains lead, BGA) | [DATA_NEEDED: RoHS status] |
| Family | — | ACEX 1K |
| Logic Elements | — | 4,992 |
| Typical Gate Count | — | 100,000 gates |
| Logic Array Blocks (LABs) | — | 624 |
| Embedded Array Blocks (EABs) | — | 12 |
| User I/Os | — | 333 |
| Operating Voltage (VCCINT) | — | 2.5 V |
| Process Technology | — | 0.22 µm CMOS |
| Internal Operating Frequency | — | up to 200 MHz |
| Gehäuse | — | 484-ball FBGA |
| I/O Standards Supported | — | LVTTL, LVCMOS, PCI, 2.5V/3.3V/5V multiVolt I/O |
| Operating Temperature (Commercial) | — | 0 °C to +70 °C |
| Boundary-Scan Test | — | IEEE 1149.1 (JTAG) |