EP1K30QC208-1 vs EP1K30QC208-2N Vergleich
Detaillierter Direktvergleich von EP1K30QC208-1 von Intel und EP1K30QC208-2N von Intel. Vergleichen Sie die wichtigsten Spezifikationen, elektrischen Parameter, Gehäuse, Lebenszyklusstatus, Preise und Verfügbarkeit, um das beste Bauteil für Ihre Designanforderungen zu ermitteln.
Spezifikationsvergleich
| Parameter | EP1K30QC208-1 | EP1K30QC208-2N |
|---|---|---|
| Marke | Intel | Intel |
| Kategorie | FPGA & CPLD | FPGA & CPLD |
| Lebenszyklusstatus | Obsolete | Obsolete |
| Lagerstatus | In Stock | In Stock |
| Stückpreis (USD) | $10,85 | $22,10 |
| Device Family | ACEX-1K | — |
| Logic Elements (LEs) | 1,728 | — |
| Equivalent Gates | 30,000 | — |
| Logic Array Blocks (LABs) | 216 | — |
| Embedded Memory (EAB) | 24,576 bits | — |
| Maximum User I/O | 147 | — |
| Core Supply Voltage (VCCINT) | 2.5 V (2.375 V to 2.625 V) | 2.5 V |
| Gehäuse | 208-BFQFP (Plastic Quad Flat Pack, PQFP208) | — |
| Terminal Pitch | 0.500 mm | — |
| Montageart | Surface Mount (gull-wing leads) | Surface Mount |
| Betriebstemperatur | 0 °C to +70 °C (commercial) | 0°C to +70°C (commercial) |
| Maximum Operating Frequency | up to 250 MHz (family typical) | — |
| Process Technology | 2.5 V CMOS | — |
| Configuration Method | SRAM, in-system reconfigurable (volatile) | SRAM (volatile) - serial/parallel/JTAG |
| Boundary-Scan Test | JTAG IEEE 1149.1 | — |
| I/O Voltage Support | 2.5 V / 3.3 V (multi-volt I/O) | — |
| Configuration Device Support | EPC2, EPC4, EPC8 Enhanced Configuration Devices | — |
| RoHS-Status | Compliant (lead-free) | unknown (legacy part, pre-RoHS-era design) |
| Series | — | ACEX 1K |
| Family | — | ACEX 1K |
| Logic Elements / Cells | — | 1,728 |
| Typical Gates | — | 30,000 |
| Total RAM Bits | — | 24,576 (24 Kbit embedded memory) |
| Number of LABs/CLBs | — | 216 |
| Number of I/O | — | 147 |
| Number of Gates | — | 30,000 |
| Technology Node | — | 0.22 µm CMOS |
| Operating Frequency (max) | — | 200 MHz |
| Gehäuse / Bauform | — | 208-BFQFP (PQFP) |