EPF6016AT1144-3N vs EPF6016AQC208-3N Vergleich
Detaillierter Direktvergleich von EPF6016AT1144-3N von Altera und EPF6016AQC208-3N von Intel. Vergleichen Sie die wichtigsten Spezifikationen, elektrischen Parameter, Gehäuse, Lebenszyklusstatus, Preise und Verfügbarkeit, um das beste Bauteil für Ihre Designanforderungen zu ermitteln.
Intel
EPF6016AQC208-3N - FLEX 6000 FPGA, 16K Gates, 1320 Cells, PQFP-208 | Intel
EPF6016AQC208-3N ObsoleteSpezifikationsvergleich
| Parameter | EPF6016AT1144-3N | EPF6016AQC208-3N |
|---|---|---|
| Marke | Altera | Intel |
| Kategorie | FPGA & CPLD | FPGA & CPLD |
| Lebenszyklusstatus | Obsolete | Obsolete |
| Lagerstatus | In Stock | In Stock |
| Stückpreis (USD) | $15,75 | $31,20 |
| Family | FLEX 6000 | FLEX 6000 |
| Device Type | SRAM-based FPGA | — |
| Typical Gates | 16,000 | — |
| Maximum Gates | 24,000 | — |
| Logic Elements (LEs) | 1,320 | — |
| Maximum User I/O Pins | 132 | — |
| Embedded Array Blocks (EABs) | 16 | — |
| Total RAM Bits | 16,704 | — |
| Supply Voltage VCCINT | 3.3 V | — |
| Supply Voltage VCCIO | 3.3 V (5.0 V tolerant input option) | — |
| Process Technology | 0.42 µm CMOS SRAM | 0.42 µm CMOS |
| Speed Grade | -3 (commercial) | -3 |
| Gehäuse | TQFP-144 (T144) 22x22 mm | 208-PQFP (28x28 mm) |
| Betriebstemperatur | [DATA_NEEDED: operating temperature range] | 0 °C to 85 °C (Commercial) |
| Montageart | Surface Mount | Surface Mount |
| Configuration Method | JTAG / ByteBlasterMV / BitBlaster with external EPC2 or EPC1441 PROM | — |
| Boundary Scan | IEEE 1149.1 (JTAG) compliant | — |
| In-System Programmability | Yes (ISP via JTAG) | — |
| RoHS-Status | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| Logic Elements / Cells | — | 1,320 |
| Equivalent Gates | — | 16,000 |
| Logic Array Blocks (LABs) | — | 132 |
| Maximum User I/Os | — | 171 |
| Operating Frequency (max) | — | 142.86 MHz |
| Versorgungsspannung | — | 3.3 V |
| Pin-Anzahl | — | 208 |
| Configuration Memory | — | SRAM (volatile, requires config device) |
| Lebenszyklusstatus | — | Obsolete (EOL) |