EPF8282ATI100-3N vs EPF8282ATC100-2W Vergleich
Detaillierter Direktvergleich von EPF8282ATI100-3N von Altera und EPF8282ATC100-2W von Altera. Vergleichen Sie die wichtigsten Spezifikationen, elektrischen Parameter, Gehäuse, Lebenszyklusstatus, Preise und Verfügbarkeit, um das beste Bauteil für Ihre Designanforderungen zu ermitteln.
Spezifikationsvergleich
| Parameter | EPF8282ATI100-3N | EPF8282ATC100-2W |
|---|---|---|
| Marke | Altera | Altera |
| Kategorie | FPGA & CPLD | FPGA & CPLD |
| Lebenszyklusstatus | Obsolete | Obsolete |
| Lagerstatus | In Stock | In Stock |
| Stückpreis (USD) | $10,95 | $7,40 |
| Family | FLEX 8000 | FLEX 8000 |
| Logic Cells | 208 | — |
| Logic Array Blocks (LABs) | 26 | — |
| Usable Gates | 2,500 | — |
| User I/Os | 78 | — |
| Maximum Operating Frequency | 125 MHz | — |
| Process Technology | 0.42 um CMOS SRAM | 0.5 micron CMOS SRAM |
| Core Supply Voltage (VCCINT) | 5 V | — |
| I/O Supply Voltage (VCCIO) | 3.3 V or 5.0 V | — |
| Gehäuse | 100-pin TQFP | 100-pin TQFP |
| Montageart | Surface Mount | Surface Mount |
| Betriebstemperatur | 0C to +70C | — |
| Configuration Memory | SRAM (volatile) | — |
| Configuration Devices Supported | EPC1, EPC1064, EPC1213, EPC1441 | — |
| In-Circuit Reconfigurability | Yes (ICR) | — |
| Boundary-Scan Support | IEEE 1149.1 JTAG | — |
| RoHS-Status | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| Logic Elements | — | 282 |
| Typical Gates | — | 2,500 |
| Maximum Gates | — | 5,000 |
| User I/O Pins | — | 78 |
| Flip-Flops | — | 208 |
| Embedded RAM Bits | — | 208 |
| Speed Grade | — | -2 |
| Operating Temperature Grade | — | Industrial ("W" suffix) |
| Configuration Method | — | SRAM, serial or parallel EPROM |
| JTAG Support | — | Yes (IEEE 1149.1 boundary-scan) |