5M570ZT100A5N vs 5M80ZT100A5N Comparación
Comparación detallada lado a lado de 5M570ZT100A5N por Intel y 5M80ZT100A5N por Altera. Compare las especificaciones clave, los parámetros eléctricos, el encapsulado, el estado del ciclo de vida, los precios y la disponibilidad para determinar el mejor componente para los requisitos de su diseño.
Comparación de especificaciones
| Parámetro | 5M570ZT100A5N | 5M80ZT100A5N |
|---|---|---|
| Marca | Intel | Altera |
| Categoría | FPGA & CPLD | FPGA & CPLD |
| Estado del ciclo de vida | Activo | Activo |
| Estado del stock | In Stock | In Stock |
| Precio unitario (USD) | $9,75 | $1,85 |
| Family | MAX V | MAX V |
| Device Logic Elements | 570 | — |
| Macrocells | 440 | — |
| Logic Array Blocks (LABs) | 8 | — |
| Maximum User I/O Pins | 74 | — |
| Maximum Operating Frequency | 118.3 MHz | — |
| Pin-to-Pin Logic Delay (tPD) | 9.0 ns | — |
| Core Voltage (VCCINT) | 1.8 V | — |
| I/O Voltage (VCCIO) | 1.8 V / 2.5 V / 3.3 V (multi-voltage I/O banks) | — |
| Encapsulado | 100-pin TQFP | 100-pin TQFP (T100) |
| Tipo de montaje | Surface Mount | Surface Mount |
| Configuration Memory | On-chip non-volatile flash | Non-volatile, on-chip flash |
| Programming Interface | JTAG (IEEE 1149.1), in-system programmable (ISP) | JTAG (IEEE 1149.1 / IEEE 1532) |
| Operating Temperature (A suffix) | -40C to +125C | — |
| Automotive Qualification | AEC-Q100 (per Arrow listing) | AEC-Q100 (A5N suffix) |
| Estado RoHS | Compliant | Compliant |
| Internal Oscillator | Yes (on-chip) | — |
| User Flash Memory | Yes (on-chip) | — |
| Macro Cells | — | 64 |
| Logic Elements / LABs | — | 8 Logic Array Blocks (LABs) |
| Maximum User I/O | — | 80 (in TQFP-100 package) |
| Pin-to-Pin Propagation Delay (tPD) | — | 7.5 ns |
| Maximum Internal Frequency (fMAX) | — | 118.3 MHz |
| Core Supply Voltage (VCCINT) | — | 1.8 V |
| I/O Bank Supply Voltage (VCCIO) | — | 1.2 V / 1.5 V / 1.8 V / 2.5 V / 3.3 V (multi-voltage banks) |
| User Flash Memory (UFM) | — | 8 Kbits (typical for MAX V 64-macrocell device) |
| Temperatura de unión de funcionamiento | — | -40 C to +125 C (automotive/industrial grade) |
| Nivel MSL | — | 3 (per JEDEC J-STD-020) |
| Supply Current (typical) | — | [DATA_NEEDED: Icc typical] |
| Global Clock Networks | — | 4 |
| Lead-Free / Halogen-Free | — | Yes / Yes (per Altera lead-free roadmap) |