EP1K30QC208-2N vs EP1K50QC208-2N Comparación
Comparación detallada lado a lado de EP1K30QC208-2N por Intel y EP1K50QC208-2N por Intel. Compare las especificaciones clave, los parámetros eléctricos, el encapsulado, el estado del ciclo de vida, los precios y la disponibilidad para determinar el mejor componente para los requisitos de su diseño.
Comparación de especificaciones
| Parámetro | EP1K30QC208-2N | EP1K50QC208-2N |
|---|---|---|
| Marca | Intel | Intel |
| Categoría | FPGA & CPLD | FPGA & CPLD |
| Estado del ciclo de vida | Obsolete | Obsolete |
| Estado del stock | In Stock | In Stock |
| Precio unitario (USD) | $22,10 | $27,80 |
| Series | ACEX 1K | ACEX-1K |
| Family | ACEX 1K | ACEX 1K |
| Logic Elements / Cells | 1,728 | — |
| Typical Gates | 30,000 | 50,000 |
| Total RAM Bits | 24,576 (24 Kbit embedded memory) | — |
| Number of LABs/CLBs | 216 | — |
| Number of I/O | 147 | — |
| Number of Gates | 30,000 | — |
| Core Supply Voltage (VCCINT) | 2.5 V | — |
| Technology Node | 0.22 µm CMOS | — |
| Operating Frequency (max) | 200 MHz | — |
| Temperatura de funcionamiento | 0°C to +70°C (commercial) | 0 °C to 85 °C (Commercial) |
| Tipo de montaje | Surface Mount | Surface Mount (Gull-Wing) |
| Encapsulado / Carcasa | 208-BFQFP (PQFP) | — |
| Configuration Method | SRAM (volatile) - serial/parallel/JTAG | — |
| Estado RoHS | unknown (legacy part, pre-RoHS-era design) | [DATA_NEEDED: RoHS status] |
| Logic Elements | — | 2,880 |
| Logic Array Blocks (LABs) | — | 360 |
| Embedded Memory (EAB SRAM) | — | 40 kbit |
| User I/Os | — | 147 |
| Number of I/O Banks | — | [DATA_NEEDED: number of I/O banks] |
| Maximum Toggle Frequency | — | 200 MHz |
| Pin-to-Pin Delay (LE) | — | 0.4 ns (per data sheet snippet) |
| Process Technology | — | 0.22 µm CMOS |
| Core Supply Voltage | — | 2.5 V |
| I/O Supply Voltage | — | [DATA_NEEDED: I/O supply voltage] |
| Configuration Interface | — | JTAG (IEEE 1149.1), Serial (PS/AS) |
| Encapsulado | — | 208-pin PQFP (BFQFP) |
| Nivel MSL | — | [DATA_NEEDED: MSL level] |