EPF6016AT1144-3N vs EPF6016ATI144-2 Comparación
Comparación detallada lado a lado de EPF6016AT1144-3N por Altera y EPF6016ATI144-2 por Altera. Compare las especificaciones clave, los parámetros eléctricos, el encapsulado, el estado del ciclo de vida, los precios y la disponibilidad para determinar el mejor componente para los requisitos de su diseño.
Comparación de especificaciones
| Parámetro | EPF6016AT1144-3N | EPF6016ATI144-2 |
|---|---|---|
| Marca | Altera | Altera |
| Categoría | FPGA & CPLD | FPGA & CPLD |
| Estado del ciclo de vida | Obsolete | NRND |
| Estado del stock | In Stock | In Stock |
| Precio unitario (USD) | $15,75 | $9,40 |
| Family | FLEX 6000 | FLEX 6000 |
| Device Type | SRAM-based FPGA | — |
| Typical Gates | 16,000 | 16,000 |
| Maximum Gates | 24,000 | — |
| Logic Elements (LEs) | 1,320 | — |
| Maximum User I/O Pins | 132 | — |
| Embedded Array Blocks (EABs) | 16 | — |
| Total RAM Bits | 16,704 | — |
| Supply Voltage VCCINT | 3.3 V | — |
| Supply Voltage VCCIO | 3.3 V (5.0 V tolerant input option) | — |
| Process Technology | 0.42 µm CMOS SRAM | — |
| Speed Grade | -3 (commercial) | -2 |
| Encapsulado | TQFP-144 (T144) 22x22 mm | TQFP-144 |
| Temperatura de funcionamiento | [DATA_NEEDED: operating temperature range] | -40 °C to 100 °C (Industrial) |
| Tipo de montaje | Surface Mount | — |
| Configuration Method | JTAG / ByteBlasterMV / BitBlaster with external EPC2 or EPC1441 PROM | OptiFLEX architecture, in-system programmable |
| Boundary Scan | IEEE 1149.1 (JTAG) compliant | — |
| In-System Programmability | Yes (ISP via JTAG) | — |
| Estado RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: rohs status] |
| Logic Elements | — | 1,320 |
| User I/O Pins | — | 117 |
| Dedicated Inputs | — | 4 |
| Frecuencia de reloj máxima | — | 153 MHz |
| Technology | — | 0.42 µm CMOS SRAM |
| Tensión de alimentación | — | 3.0 V to 3.6 V (nominal 3.3 V) |
| I/O Tolerance | — | 5.0 V tolerant |
| Terminal Pitch | — | 0.500 mm |
| Configuration | — | SRAM, serial EPROM interface |
| JTAG Support | — | IEEE 1149.1 boundary-scan |