EPM3064ATI44-4N vs EPM3064ATC44-7N Comparación
Comparación detallada lado a lado de EPM3064ATI44-4N por Altera y EPM3064ATC44-7N por Altera. Compare las especificaciones clave, los parámetros eléctricos, el encapsulado, el estado del ciclo de vida, los precios y la disponibilidad para determinar el mejor componente para los requisitos de su diseño.
Comparación de especificaciones
| Parámetro | EPM3064ATI44-4N | EPM3064ATC44-7N |
|---|---|---|
| Marca | Altera | Altera |
| Categoría | FPGA & CPLD | FPGA & CPLD |
| Estado del ciclo de vida | NRND | Obsolete |
| Estado del stock | In Stock | In Stock |
| Precio unitario (USD) | $4,25 | $2,30 |
| Family | MAX 3000A | MAX 3000A |
| Device Type | CPLD (Complex Programmable Logic Device) | CPLD (Complex Programmable Logic Device) |
| Logic Elements / Macrocells | 64 macrocells | — |
| Usable Gates | 1,250 gates | 1,250 |
| Number of Logic Array Blocks (LABs) | 4 LABs (16 macrocells each) | — |
| Maximum Operating Frequency | 222.2 MHz | — |
| Pin-to-Pin Propagation Delay (tPD) | 4.5 ns (-4 speed grade) | — |
| Supply Voltage - Core (VCCINT) | 3.3 V | — |
| Supply Voltage - I/O (VCCIO) | 3.3 V or 2.5 V | — |
| User I/O Pins | 34 I/O | 34 |
| Encapsulado | 44-pin TQFP | 44-pin TQFP |
| Temperatura de funcionamiento | -40C to +85C (industrial) | 0°C to +85°C (commercial) |
| Programming Interface | IEEE Std. 1149.1 JTAG, IEEE Std. 1532 ISP | — |
| Configuration Memory | EEPROM (non-volatile) | — |
| Tipo de montaje | Surface Mount | Surface Mount |
| Estado RoHS | [DATA_NEEDED: rohs status] | Compliant |
| Macro Cells | — | 64 |
| Logic Array Blocks | — | 2 |
| Número de pines | — | 44 |
| Speed Grade | — | -7 (7.5 ns pin-to-pin delay) |
| Pin-to-Pin Delay (tPD) | — | 7.5 ns |
| Maximum Counter Frequency | — | 192.3 MHz (-7 grade) |
| Supply Voltage (VCC) | — | 3.3 V |
| MultiVolt I/O | — | 1.8 V / 2.5 V / 3.3 V |
| Programmability | — | EEPROM, in-system programmable (ISP) |
| JTAG Interface | — | IEEE Std. 1149.1 compliant |
| ISP Standard | — | IEEE Std. 1532 compliant |
| Boundary-Scan Test (BST) | — | Built-in, JTAG-driven |