MC9S08QE4CLC vs MC9S08QE96CLD Comparación
Comparación detallada lado a lado de MC9S08QE4CLC por NXP Semiconductors y MC9S08QE96CLD por NXP Semiconductors. Compare las especificaciones clave, los parámetros eléctricos, el encapsulado, el estado del ciclo de vida, los precios y la disponibilidad para determinar el mejor componente para los requisitos de su diseño.
Comparación de especificaciones
| Parámetro | MC9S08QE4CLC | MC9S08QE96CLD |
|---|---|---|
| Marca | NXP Semiconductors | NXP Semiconductors |
| Categoría | Microcontrollers | Microcontrollers |
| Estado del ciclo de vida | Fin de vida | Activo |
| Estado del stock | In Stock | In Stock |
| Precio unitario (USD) | $5,38 | $3,55 |
| CPU Architecture | HCS08, 8-bit | — |
| Frecuencia de reloj máxima | 20 MHz | — |
| Flash Memory | 4 KB | 96 KB |
| Flash Organization | 4K x 8 bits | — |
| RAM | 512 bytes | — |
| Supply Voltage Range | 1.8 V to 3.6 V | — |
| I/O Port Count | 28 | — |
| Package Type | 32-LQFP | LQFP |
| Package Dimensions | 7 x 7 mm | — |
| Package Height | 1.40 mm maximum | 1.40 mm |
| Package Pitch | 0.80 mm | 0.80 mm |
| Tipo de montaje | Surface mount | Surface mount |
| ADC Resolution | 12-bit | — |
| Rango de temperatura de funcionamiento | -40 C to +85 C | — |
| Series | S08QE | — |
| Product Family | Flexis series | — |
| Estado RoHS | [DATA_NEEDED: RoHS status] | — |
| REACH Status | [DATA_NEEDED: REACH status] | — |
| AEC-Q100 Qualification | [DATA_NEEDED: AEC-Q100 qualification] | — |
| Product Type | — | 8-bit HCS08 microcontroller |
| Core | — | HCS08 |
| Memory Organization | — | 96K x 8 flash |
| Maximum Listed Clock | — | 50 MHz |
| Alternative Listed Clock | — | 16 MHz |
| CPU Operating Point | — | 50.33 MHz from 2.1 V; 20 MHz from 1.8 V |
| Tensión de alimentación | — | 1.8 V to 3.6 V |
| LCD Driver | — | Integrated LCD driver |
| I/O Ports | — | 28 |
| Encapsulado | — | 44-LQFP, 10 x 10 mm |
| Instruction Set | — | HC08 |
| Tipo de memoria | — | Flash |
| Background Debug | — | Background debugging system |
| Breakpoint Capability | — | Single breakpoint setting during in-circuit debugging, with two additional on-chip breakpoints |
| RoHS | — | [DATA_NEEDED: RoHS status] |
| REACH | — | [DATA_NEEDED: REACH status] |
| AEC-Q100 | — | [DATA_NEEDED: AEC-Q100 qualification] |
| Temperatura de funcionamiento | — | [DATA_NEEDED: operating temperature range] |