EP1C12Q240I6 vs EP1C12Q240I8ES Comparaison

Comparaison détaillée côte à côte de EP1C12Q240I6 par Altera et EP1C12Q240I8ES par Intel. Comparez les spécifications clés, les paramètres électriques, le conditionnement, le statut de cycle de vie, les prix et la disponibilité pour déterminer le meilleur composant pour vos exigences de conception.

Comparaison des spécifications

Paramètre EP1C12Q240I6 EP1C12Q240I8ES
Marque Altera Intel
Catégorie FPGA & CPLD FPGA & CPLD
Statut du cycle de vie Obsolete Obsolete
Statut du stock In Stock In Stock
Prix unitaire (USD) $55,00 $7,15
Family Cyclone FPGA —
Logic Elements 12,060 —
Total RAM Bits 239,616 bits —
Embedded M4K RAM Blocks 52 —
Maximum User I/O 249 —
PLLs 2 (with 4 outputs each) —
Maximum Internal Frequency 405 MHz —
Process Technology 130 nm —
Core Voltage 1.5 V —
Package Type 240-pin PQFP (Plastic Quad Flat Pack) —
Terminal Form Gull Wing GULL WING
Temperature Grade Industrial (I) —
Speed Grade 6 8
I/O Standards Supported LVDS, PCI, SSTL-2, LVTTL, LVCMOS —
Configuration Methods AS, PS, JTAG (IEEE 1149.1) —
Embedded Multipliers [DATA_NEEDED: 18x18 multiplier count] —
Statut RoHS [DATA_NEEDED] unknown
Manufacturer — Intel
Manufacturer Part Number — EP1C12Q240I8ES
FPGA Family — Cyclone
Programmable Logic Type — FPGA (field-programmable gate array)
Configuration Type — SRAM-based
FPGA Process — 1.5-V, 0.13-um, all-layer copper SRAM process
Maximum Family Logic Elements — 20,060 LEs
Maximum Family Embedded RAM — 288 Kbits
EP1C12 Delivered Logic Elements — [DATA_NEEDED: EP1C12 exact LE count]
Package Code — FQFP
Package Description — 240-pin square QFP (PQFP/FQFP)
Number of Terminals — 240
Package Shape — Square
JESD-609 Code — e0
Maximum Supply Voltage — 1.575 V
Nominal Core Supply Voltage — 1.5 V
Temperature Grade Code — I (industrial)
Ordering Code Variant — ES (engineering sample)
Minimum Operating Temperature — [DATA_NEEDED: minimum operating temperature]
Maximum Operating Temperature — [DATA_NEEDED: maximum operating temperature]
Supported Configuration — Configuration and JTAG boundary-scan testing supported

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