RTAX2000DL-1CQ352E vs RTAX2000D-CQ352B Comparaison
Comparaison détaillée côte à côte de RTAX2000DL-1CQ352E par Microchip Technology et RTAX2000D-CQ352B par Microsemi. Comparez les spécifications clés, les paramètres électriques, le conditionnement, le statut de cycle de vie, les prix et la disponibilité pour déterminer le meilleur composant pour vos exigences de conception.
Microchip Technology
RTAX2000DL-1CQ352E - 2M-Gate Rad-Tolerant FPGA | Microchip
RTAX2000DL-1CQ352E ✓ ActifMicrosemi
RTAX2000D-CQ352B - 2M-Gate Rad-Tolerant FPGA, CQFP-352 | Microchip
RTAX2000D-CQ352B ✓ ActifComparaison des spécifications
| Paramètre | RTAX2000DL-1CQ352E | RTAX2000D-CQ352B |
|---|---|---|
| Marque | Microchip Technology | Microsemi |
| Catégorie | FPGA & CPLD | FPGA & CPLD |
| Statut du cycle de vie | Actif | Actif |
| Statut du stock | In Stock | In Stock |
| Prix unitaire (USD) | $2 300,00 | $3 100,00 |
| Equivalent System Gates | 2000000 gates | 2000000 |
| Configurable Logic Blocks (CLBs) | 19712 | — |
| Logic Cells | 29568 | 29568 |
| DSP Mathblocks | Up to 120 | — |
| DSP MAC Performance | 125 MHz 18-bit x 18-bit multiply-accumulate | — |
| Embedded Memory | Up to 540 kbits SRAM with optional EDAC | Embedded SRAM with built-in FIFO control logic |
| Core Supply Voltage | 1.5 V nominal (1.425 V to 1.575 V) | 1.5 V nominal (1.425 V to 1.575 V) |
| Technology | Digital CMOS, antifuse (nonvolatile, one-time programmable) | — |
| Total Ionizing Dose (Functional) | 300 krad(Si) | — |
| Total Ionizing Dose (Parametric rating) | 200 krad(Si) | — |
| User I/O | 166 input and 166 output terminals | — |
| Boîtier | 352-terminal CQFP (Ceramic Quad Flat Pack), column E lead finish | CQFP-352 ceramic quad flat pack |
| Type de montage | Surface Mount | Surface Mount |
| Family | RTAX-DSP / RTAX-SL radiation-tolerant FPGAs | RTAX-S/SL and RTAX-DSP Radiation-Tolerant FPGAs |
| Configuration | Live at power-up, no external configuration device | — |
| Température de fonctionnement | [DATA_NEEDED: operating temperature range] | [DATA_NEEDED: Operating Temperature Range] |
| Speed Grade | -1 (standard) | — |
| Statut RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS Status] |
| CLBs | — | 19712 |
| Process Technology | — | CMOS antifuse |
| Configuration Type | — | One-time programmable antifuse, live at power-up |
| Clocking Features | — | Segmentable clocks, chip-wide highway routing |
| Arithmetic Support | — | Carry logic |
| Screening / Speed Grade | — | B (burn-in screening); D suffix = tighter ICCA limits at 125C final test |
| Application Domain | — | Space-flight systems |
| Radiation Tolerance | — | Radiation-tolerant (TID/SEE per family datasheet) |
| I/O Supply Voltage | — | [DATA_NEEDED: I/O Bank Supply Voltage] |
| Maximum User I/O | — | [DATA_NEEDED: Maximum User I/O Count] |