RTAX4000SL-1LG1272EV vs RTAX4000SL-CG1272E Comparaison
Comparaison détaillée côte à côte de RTAX4000SL-1LG1272EV par Microchip Technology et RTAX4000SL-CG1272E par Microsemi. Comparez les spécifications clés, les paramètres électriques, le conditionnement, le statut de cycle de vie, les prix et la disponibilité pour déterminer le meilleur composant pour vos exigences de conception.
Microchip Technology
RTAX4000SL-1LG1272EV - 4M-Gate Rad-Tolerant FPGA | Microchip
RTAX4000SL-1LG1272EV ✓ ActifMicrosemi
RTAX4000SL-CG1272E - 4M-Gate Rad-Tolerant FPGA CCGA-1272 | Microsemi
RTAX4000SL-CG1272E ✓ ActifComparaison des spécifications
| Paramètre | RTAX4000SL-1LG1272EV | RTAX4000SL-CG1272E |
|---|---|---|
| Marque | Microchip Technology | Microsemi |
| Catégorie | FPGA & CPLD | FPGA & CPLD |
| Statut du cycle de vie | Actif | Actif |
| Statut du stock | In Stock | In Stock |
| Prix unitaire (USD) | $0,00 | $0,00 |
| Family | RTAX-SL Radiation-Tolerant FPGA | RTAX-SL Radiation-Tolerant FPGA |
| System Gates | 4,000,000 | 4,000,000 |
| Logic Cells (CLBs) | 40,320 | — |
| Logic Elements | 60,480 | — |
| Process Technology | 0.15 um CMOS | 0.15 um CMOS |
| Core Supply Voltage | 1.5 V | 1.5 V |
| Boîtier | 1272-Pin LGA (LG1272) | 1272-Pin CCGA (Ceramic Column Grid Array) |
| Speed Grade | -1 | — |
| Screening Flow | EV (Space-Grade Variant Suffix) | — |
| Programming Technology | Antifuse (one-time programmable) | Antifuse (one-time programmable) |
| Configuration | Live at power-up, single chip | — |
| Type de montage | Surface Mount | Surface Mount |
| Température de fonctionnement | [DATA_NEEDED: operating temperature range] | -55C to +125C |
| Radiation Tolerance | [DATA_NEEDED: TID / SEU figures] | — |
| Embedded Memory | [DATA_NEEDED: embedded SRAM block capacity] | — |
| Statut RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| I/O Count | [DATA_NEEDED: user I/O count for LG1272] | — |
| Logic Cells | — | 40320 |
| Sequential Logic Cells | — | 60480 |
| Logic Family | — | CMOS |
| SEU Immunity | — | Immune to single-event upsets to LETTH MeVcm2/mg |
| SEU Rate | — | < 10-10 errors/bit-day |
| SEU-Hardened Registers | — | Yes (eliminates need for TMR) |
| Power-Up Operation | — | Live at power-up (single chip) |
| Radiation Environment | — | Space flight (radiation-tolerant) |