RTAX4000SL-CG1272B vs RTAX4000SL-CG1272E Comparaison
Comparaison détaillée côte à côte de RTAX4000SL-CG1272B par Microchip Technology et RTAX4000SL-CG1272E par Microsemi. Comparez les spécifications clés, les paramètres électriques, le conditionnement, le statut de cycle de vie, les prix et la disponibilité pour déterminer le meilleur composant pour vos exigences de conception.
Microchip Technology
RTAX4000SL-CG1272B - 4M-Gate Rad-Tolerant FPGA CCGA1272 | Microchip
RTAX4000SL-CG1272B ✓ ActifMicrosemi
RTAX4000SL-CG1272E - 4M-Gate Rad-Tolerant FPGA CCGA-1272 | Microsemi
RTAX4000SL-CG1272E ✓ ActifComparaison des spécifications
| Paramètre | RTAX4000SL-CG1272B | RTAX4000SL-CG1272E |
|---|---|---|
| Marque | Microchip Technology | Microsemi |
| Catégorie | FPGA & CPLD | FPGA & CPLD |
| Statut du cycle de vie | Actif | Actif |
| Statut du stock | In Stock | In Stock |
| Prix unitaire (USD) | $0,00 | $0,00 |
| Family | RTAX-SL | RTAX-SL Radiation-Tolerant FPGA |
| Equivalent System Gates | 4,000,000 | — |
| Logic Cells (CLBs) | 40320 | — |
| Process Technology | 0.15 um | 0.15 um CMOS |
| Core Supply Voltage | 1.5 V | 1.5 V |
| Boîtier | 1272-pin CCGA (Ceramic Column Grid Array) | 1272-Pin CCGA (Ceramic Column Grid Array) |
| Programming Type | One-Time Programmable (antifuse) | — |
| Radiation Tolerance | Radiation-tolerant (space-flight qualified family) | — |
| Configuration | Single-chip, live-at-power-up | — |
| Type de montage | Surface Mount | Surface Mount |
| Température de fonctionnement | [DATA_NEEDED: operating temperature range] | -55C to +125C |
| Max User I/O | [DATA_NEEDED: maximum user I/O count] | — |
| Embedded Memory | [DATA_NEEDED: embedded SRAM block capacity] | — |
| Speed Grade | Standard (non -1 grade) | — |
| Niveau MSL | [DATA_NEEDED: moisture sensitivity level] | — |
| Statut RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| System Gates | — | 4,000,000 |
| Logic Cells | — | 40320 |
| Sequential Logic Cells | — | 60480 |
| Logic Family | — | CMOS |
| SEU Immunity | — | Immune to single-event upsets to LETTH MeVcm2/mg |
| SEU Rate | — | < 10-10 errors/bit-day |
| SEU-Hardened Registers | — | Yes (eliminates need for TMR) |
| Programming Technology | — | Antifuse (one-time programmable) |
| Power-Up Operation | — | Live at power-up (single chip) |
| Radiation Environment | — | Space flight (radiation-tolerant) |