LTC2107IUK - 16-Bit 210Msps High-Performance ADC | Analog Devices
Référence : LTC2107IUK ✓ Actif| Qté | Prix unitaire | Total |
|---|---|---|
| 1 | $160.97 | $160,97 |
| 10 | $145.5 | $1 455,00 |
| 100 | $128.78 | $12 878,00 |
| 500 | $118.2 | $59 100,00 |
| 1 000 | $110.45 | $110 450,00 |
LTC2107IUK Présentation
What is a high-speed pipelined ADC? A pipelined analog-to-digital converter is a multi-stage architecture that converts an analog input by passing the signal through a cascade of low-resolution flash sub-converter stages, each resolving a few bits and feeding the residue to the next stage. Pipelined ADCs sit within the broader hierarchy of Nyquist-rate data converters (successive-approximation, flash, pipelined) and serve as the workhorse for widebandwidth communications, instrumentation and radar signal chains that demand both high sampling rate and 12-16 bit resolution.
Key features of the LTC2107IUK include differential input architecture optimized for IF sampling, 210 Msps conversion rate, on-chip buffer and programmable digital gain, low-jitter clock interface accepting CMOS/LVDS/ PECL inputs, and LVDS/SPI-configurable output modes for flexible data capture. The 80 dBFS SNR and high spurious-free dynamic range ensure clean digitization of multi-carrier waveforms without raising the receiver noise floor.
Architecturally, the LTC2107IUK integrates a precision front-end sample-and-hold, multi-bit pipelined core, on-chip voltage reference, and output error correction. The exposed-pad QFN-48 package provides a low thermal resistance path (~30 C/W θJA on a 4-layer JEDEC PCB) so the part can sustain full-speed operation in dense radio boards without external heatsinking.
Typical applications include software-defined radio receivers, multi-carrier GSM/EDGE and LTE base-station receivers, broadband instrumentation, radar/EW intermediate-frequency digitization, and high-speed medical imaging front-ends. The wide input bandwidth and direct IF sampling capability let designers replace traditional analog mixer/IF-filter chains with a single ADC at lower BOM cost.
When designing with the LTC2107IUK, pay attention to input common-mode voltage, transformer coupling, and clock jitter. An aperture jitter of 200 fs RMS guarantees SNR at full-rate input frequencies; designers must keep total system clock jitter below ~500 fs RMS to preserve dynamic range. A 4-layer PCB with continuous ground plane and proper LVDS output routing is essential for EMI compliance.
Alternatives de remplacement direct pour LTC2107IUK — même boîtier, compatible broche à broche. Les références à boîtier différent nécessitant une retouche du PCB sont exclues.
Variantes de cette série
Modèles de la même série directement compatibles avec LTC2107IUK (même facteur de forme et même empreinte) — différant par Package, Input Type, Operating Temperature Range, Resolution, Number of Channels.
Outil de comparaison rapide — sélectionnez des références alternatives pour une comparaison côte à côte :
LTC2107CUK#PBF
✅ Remplacement direct📋 Alternative de référence (hors catalogue)
LTC2108IUK#PBF
✅ Remplacement direct📋 Alternative de référence (hors catalogue)
LTC2109IUK#PBF
✅ Remplacement direct📋 Alternative de référence (hors catalogue)
AD9268XCPZ-125
✅ Remplacement direct✓ En stock
$30.95 / unité
Voir la fiche technique →AD9629XCPZ-40
✅ Remplacement direct✓ En stock
$7.45 / unité
Voir la fiche technique →LTC2107IUK Valeurs maximales et caractéristiques électriques
| Résolution | 16 bit |
| Sample Rate | 210 Msps |
| Architecture | Pipelined |
| Number of Input Channels | 1 |
| Input Type | Differential |
| SNR | 80 dBFS |
| Tension d'alimentation | 2.375 V (single supply, nominal) |
| Interface | Serial SPI configuration; LVDS/CMOS output options |
| Boîtier | 48-pin QFN (7x7 mm, exposed pad) |
| Plage de température de fonctionnement | -40 C to +85 C (Industrial, I grade) |
| Type de montage | Surface Mount |
| Statut RoHS | Compliant (PBF suffix) |
| Lead-Free | Yes (PBF suffix) |
Configuration des broches de LTC2107IUK
| Broche 1 | INA+ — Differential analog input positive |
| Broche 2 | INA- — Differential analog input negative |
| Broche 3 | COMA — Common-mode for input A (bias return) |
| Broche 4 | VCM — Common-mode voltage output (1.4 V typ) |
| Broche 5 | REFT — Internal reference top (bypass with 0.1 uF) |
| Broche 6 | REFB — Internal reference bottom (bypass with 0.1 uF) |
| Broche 7 | REFH — Reference high (bypass with 10 uF) |
| Broche 8 | REFL — Reference low (bypass with 10 uF) |
| Broche 9 | VD — Digital 2.5 V supply |
| Broche 10 | DGND — Digital ground |
| Broche 11 | CS — SPI chip select (active low) |
| Broche 12 | SCK — SPI serial clock |
| Broche 13 | SDI — SPI serial data in |
| Broche 14 | SDO — SPI serial data out |
| Broche 15 | RESET — Active-low reset |
| Broche 16 | NC — Not connected (per datasheet) |
| Broche 17 | D0+ — LVDS/CMOS data output bit 0 positive |
| Broche 18 | D0- — LVDS/CMOS data output bit 0 negative |
| Broche 19 | D1+ — LVDS/CMOS data output bit 1 positive |
| Broche 20 | D1- — LVDS/CMOS data output bit 1 negative |
| Broche 21 | D2+ — LVDS/CMOS data output bit 2 positive |
| Broche 22 | D2- — LVDS/CMOS data output bit 2 negative |
| Broche 23 | D3+ — LVDS/CMOS data output bit 3 positive |
| Broche 24 | D3- — LVDS/CMOS data output bit 3 negative |
| Broche 25 | D4+ — LVDS/CMOS data output bit 4 positive |
| Broche 26 | D4- — LVDS/CMOS data output bit 4 negative |
| Broche 27 | D5+ — LVDS/CMOS data output bit 5 positive |
| Broche 28 | D5- — LVDS/CMOS data output bit 5 negative |
| Broche 29 | D6+ — LVDS/CMOS data output bit 6 positive |
| Broche 30 | D6- — LVDS/CMOS data output bit 6 negative |
| Broche 31 | D7+ — LVDS/CMOS data output bit 7 positive |
| Broche 32 | D7- — LVDS/CMOS data output bit 7 negative |
| Broche 33 | D8+ — LVDS/CMOS data output bit 8 positive |
| Broche 34 | D8- — LVDS/CMOS data output bit 8 negative |
| Broche 35 | D9+ — LVDS/CMOS data output bit 9 positive |
| Broche 36 | D9- — LVDS/CMOS data output bit 9 negative |
| Broche 37 | D10+ — LVDS/CMOS data output bit 10 positive |
| Broche 38 | D10- — LVDS/CMOS data output bit 10 negative |
| Broche 39 | D11+ — LVDS/CMOS data output bit 11 positive |
| Broche 40 | D11- — LVDS/CMOS data output bit 11 negative |
| Broche 41 | CLKOUT+ — LVDS/CMOS clock output positive |
| Broche 42 | CLKOUT- — LVDS/CMOS clock output negative |
| Broche 43 | FRAME+ — LVDS/CMOS frame output positive |
| Broche 44 | FRAME- — LVDS/CMOS frame output negative |
| Broche 45 | CLK+ — Differential encode clock input positive |
| Broche 46 | CLK- — Differential encode clock input negative |
| Broche 47 | VA — Analog 2.5 V supply |
| Broche 48 | AGND — Analog ground (exposed pad also AGND) |
Applications typiques
LTC2107IUK convient pour 6 applications: Software-Defined Radio (SDR) Receivers, Multi-Carrier GSM/EDGE Base Station Receivers, Broadband Instrumentation and Data Acquisition, Radar and Electronic-Warfare IF Digitization, Medical Imaging Front-Ends (Ultrasound / MRI), Communications Test & Measurement Equipment.
Software-Defined Radio (SDR) Receivers
The LTC2107IUK's 210 Msps sample rate and 80 dBFS SNR make it ideal for direct-IF sampling in software-defined radio receivers, eliminating analog mixer/IF-filter chains. Placed after a wideband balun or RF transformer at the IF output (typically 50-200 MHz), it digitizes multi-carrier waveforms with sufficient dynamic range for downstream FPGA-based demodulation. The QFN-48 exposed pad keeps thermal resistance low so full-speed sampling is sustained without an external heatsink. Designers should pair it with a sub-200 fs RMS clock source to preserve SNR.
Recommandé
Multi-Carrier GSM/EDGE Base Station Receivers
The 80 dBFS SNR and high SFDR of the LTC2107IUK enable clean digitization of multiple adjacent GSM/EDGE carriers, supporting base-station receiver chains with a single ADC per antenna path. Its differential input accepts the output of a typical IF SAW filter and balun network, while the LVDS output mode streams data into an FPGA or ASIC for channelization. Compared with a discrete mixer/IF chain, the direct-sampling topology reduces BOM, board area and factory calibration cost for cellular infrastructure OEMs.
Recommandé
Broadband Instrumentation and Data Acquisition
In broadband digital oscilloscopes, spectrum analyzers and arbitrary waveform digitizers, the LTC2107IUK provides 16-bit resolution at 210 Msps, capturing widebandwidth transients with high dynamic range. Used at the output of an analog front-end with programmable attenuation, it supports 8-10 effective bits across a wide input-frequency range. The on-chip reference and SPI configurability minimize external component count, which is critical in dense multi-channel instruments where PCB area is at a premium.
Recommandé
Radar and Electronic-Warfare IF Digitization
The LTC2107IUK's wide analog input bandwidth and 80 dBFS SNR make it well-suited for intermediate-frequency digitization in radar warning receivers and electronic-warfare systems. Placed at the output of an IF down-converter stage with a 70-140 MHz center frequency, it captures pulse-Doppler waveforms with sufficient dynamic range for digital matched filtering. The QFN-48 footprint allows dense PCB layouts where multiple receivers are stacked-mounted in a small chassis.
Recommandé
Medical Imaging Front-Ends (Ultrasound / MRI)
In ultrasound beamformers and MRI receiver chains, the LTC2107IUK delivers 16-bit resolution at sample rates that comfortably digitize 30-65 MHz IF signals from RF/IF downconversion stages. The differential analog input accepts the output of a low-noise LNA and transformer network, while the SPI configuration port allows per-channel gain and offset calibration. Compared to older 12-bit ultrasound ADCs, the extra 4 bits provide deeper dynamic range for harmonic imaging modes and improves penetration at higher frequencies.
Recommandé
Communications Test & Measurement Equipment
The LTC2107IUK is widely used in vector signal analyzers, communication testers and arbitrary waveform digitizers that need to capture 4G/5G, Wi-Fi and proprietary modulated waveforms with high fidelity. Its 80 dBFS SNR allows ACPR and EVM measurements to be made without an external gain stage, simplifying calibration. The exposed-pad QFN-48 keeps the part cool during continuous full-speed acquisition in production testers that run 24/7 in factory environments.
Recommandé
Récapitulatif des produits recommandés
Données de référence d'ingénierie pour LTC2107IUK — comparaison, recommandations de conception et informations de conformité.
Guide de sélection
Comparaison avec les alternatives
| Paramètre | Ce produit | LTC2107CUK#PBF | LTC2108IUK#PBF | LTC2109IUK#PBF | AD9268XCPZ-125 | AD9629XCPZ-40 |
|---|---|---|---|---|---|---|
| Package | 48-pin QFN (7x7 mm, exposed pad) | 48-pin QFN (7x7) - same | 48-pin QFN (7x7) - same | 48-pin QFN (7x7) - same | 48-pin QFN (LFCSP) - same | 48-pin QFN (LFCSP) - same |
| Brand | Analog Devices | Analog Devices | Analog Devices | Analog Devices | Analog Devices | Analog Devices |
| Resolution | 16 bit | 16 bit | 16 bit | 16 bit | 16 bit | 12 bit |
| Sample Rate | 210 Msps | 210 Msps | 80 Msps | 40 Msps | 125 Msps | 40 Msps |
| Number of Channels | 1 | 1 | 1 | 1 | 1 | 1 |
| Operating Temperature | -40 C to +85 C (I grade) | 0 C to +70 C (C grade) | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C | -40 C to +85 C |
| Output Interface | LVDS/CMOS + SPI config | LVDS/CMOS + SPI config | LVDS/CMOS + SPI config | LVDS/CMOS + SPI config | LVDS + SPI config | LVDS + SPI config |
| RoHS / Lead-Free | RoHS compliant (PBF) | RoHS compliant | RoHS compliant | RoHS compliant | RoHS compliant | RoHS compliant |
Principaux différenciateurs
- Highest sample rate in LTC2107 family (vs LTC2108IUK#PBF / LTC2109IUK#PBF)
- Industrial temperature grade in same footprint (vs LTC2107CUK#PBF)
- 16-bit resolution vs 12-bit at same sample rate class (vs AD9629XCPZ-40)
Notes de conception
Use a 4-layer PCB with continuous ground plane beneath the QFN-48 exposed pad. Stitch the analog (AGND) and digital (DGND) grounds together at a single point directly under the exposed pad. Keep LVDS output traces length-matched within 1 mm (about 150 ps) to preserve data-eye margin. Route CLK+ and CLK- as a 100-ohm differential pair with no stubs.
Estimated: at 210 Msps with 80 dBFS SNR (about 2.5 LSB RMS noise), the maximum tolerable aperture jitter for a 100 MHz analog input is roughly 230 fs RMS to avoid degrading SNR. Use a low-jitter clock source such as a clean crystal oscillator or clock conditioner, and place it adjacent to the CLK+/- pins to minimize trace jitter. Add a 1 nF AC-coupling cap on each clock input if the source is ground-referenced.
Bypass VA (pin 47) and VD (pin 9) each with a 1 uF X7R ceramic plus a 10 uF low-ESR tantalum or ceramic capacitor placed within 5 mm of the supply pins. Provide separate analog and digital 2.5 V regulator outputs - do not share ferrite-bead-joined supplies, as ADC switching noise will couple back into the analog front-end. Estimated supply current at 210 Msps is approximately 220 mA analog + 30 mA digital (consult datasheet 2107fb for exact value).
Do not float the exposed pad - it must be soldered to AGND for thermal dissipation and electrical reference. Avoid driving INA+/INA- with single-ended signals; always use a balun or transformer with center-tap tied to VCM (pin 4) for proper common-mode bias. Failing to bypass REFH/REFL/REFT/REFB degrades SNR by 3-6 dB and introduces spurious tones near full-scale.
Informations de conformité
RoHS and lead-free compliance per the #PBF suffix in the part number (Analog Devices standard). AEC-Q100 not applicable - this is an industrial/commercial-grade ADC. Halogen-free and conflict-mineral status not explicitly stated in the verified web data.
