MC9S08QE8CTG vs MC9S08QE96CLD तुलना
विस्तृत दोनों ओर की तुलना MC9S08QE8CTG द्वारा NXP Semiconductors और MC9S08QE96CLD द्वारा NXP Semiconductors. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
NXP Semiconductors
MC9S08QE8CTG - 8-Bit S08 MCU, 8KB Flash, 20MHz | NXP (Tape & Reel)
MC9S08QE8CTG ✓ सक्रिय
विशेषता तुलना
| पैरामीटर | MC9S08QE8CTG | MC9S08QE96CLD |
|---|---|---|
| ब्रांड | NXP Semiconductors | NXP Semiconductors |
| श्रेणी | Microcontrollers | Microcontrollers |
| लाइफसाइकिल स्थिति | सक्रिय | सक्रिय |
| Core Processor | S08 | — |
| Core Size | 8-Bit | — |
| Architecture | CISC | — |
| Speed | 20 MHz | — |
| Program Memory Size | 8KB (8K x 8) | — |
| Program Memory Type | FLASH | — |
| RAM Size | 512 x 8 | — |
| Number of I/O | 12 | — |
| सप्लाई वोल्टेज | 2.5V / 3.3V | 1.8 V to 3.6 V |
| Oscillator Type | Internal | — |
| पैकेज / केस | 16-TSSOP (0.173", 4.40mm Width) | — |
| पिन काउंट | 16 | — |
| माउंटिंग प्रकार | Surface Mount | Surface mount |
| Packaging | Tape & Reel (R suffix) | — |
| ऑपरेटिंग तापमान | [DATA_NEEDED: Operating Temperature range] | [DATA_NEEDED: operating temperature range] |
| Peripherals | LCD driver, voltage regulator, analog peripherals (per NXP product page) | — |
| RoHS स्थिति | [DATA_NEEDED: RoHS status] | — |
| Product Type | — | 8-bit HCS08 microcontroller |
| Core | — | HCS08 |
| Flash Memory | — | 96 KB |
| Memory Organization | — | 96K x 8 flash |
| Maximum Listed Clock | — | 50 MHz |
| Alternative Listed Clock | — | 16 MHz |
| CPU Operating Point | — | 50.33 MHz from 2.1 V; 20 MHz from 1.8 V |
| LCD Driver | — | Integrated LCD driver |
| I/O Ports | — | 28 |
| पैकेज | — | 44-LQFP, 10 x 10 mm |
| Package Type | — | LQFP |
| Package Height | — | 1.40 mm |
| Package Pitch | — | 0.80 mm |
| Instruction Set | — | HC08 |
| मेमोरी प्रकार | — | Flash |
| Background Debug | — | Background debugging system |
| Breakpoint Capability | — | Single breakpoint setting during in-circuit debugging, with two additional on-chip breakpoints |
| RoHS | — | [DATA_NEEDED: RoHS status] |
| REACH | — | [DATA_NEEDED: REACH status] |
| AEC-Q100 | — | [DATA_NEEDED: AEC-Q100 qualification] |