RTAX4000S-1CG1272V vs RTAX4000SL-1CG1272EV तुलना
विस्तृत दोनों ओर की तुलना RTAX4000S-1CG1272V द्वारा Microchip Technology और RTAX4000SL-1CG1272EV द्वारा Microchip Technology. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
Microchip Technology
RTAX4000S-1CG1272V - 4M-Gate Rad-Tolerant FPGA | Microchip
RTAX4000S-1CG1272V ✓ सक्रियMicrochip Technology
RTAX4000SL-1CG1272EV - 4M-Gate Rad-Tolerant FPGA CCGA-1272 | Microchip
RTAX4000SL-1CG1272EV ✓ सक्रियविशेषता तुलना
| पैरामीटर | RTAX4000S-1CG1272V | RTAX4000SL-1CG1272EV |
|---|---|---|
| ब्रांड | Microchip Technology | Microchip Technology |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | सक्रिय | सक्रिय |
| Logic Cells | 60480 | 40,320 |
| CLBs (Combinatorial Logic Blocks) | 40320 | — |
| Equivalent System Gates | 4000000 gates | — |
| Family | RTAX-S Radiation-Tolerant FPGA | RTAX-SL (Radiation-Tolerant FPGA) |
| Supply Voltage (Nominal) | 1.5 V | — |
| Speed Grade | -1 | — |
| पैकेज | CBGA1272 (CG1272) ceramic column grid array | 1272-Pin CCGA (Ceramic Column Grid Array) |
| Terminal Pitch | 1.000 mm | — |
| Ball/Column Count | 1272 | — |
| ऑपरेटिंग तापमान रेंज | -55C to +125C | — |
| Programmability | One-Time Programmable (antifuse) OTP | — |
| Configuration | Live at power-up, true single-chip | Live-at-power-up (antifuse, single-chip) |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Clock Architecture | Segmentable clocks, chip-wide highway routing | — |
| माउंटिंग प्रकार | Surface Mount | Surface Mount |
| Application Domain | Space-flight systems (radiation-tolerant) | Space-flight systems |
| RoHS स्थिति | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| System Gates | — | 4,000,000 equivalent system gates |
| Process Technology | — | 0.15 um CMOS |
| Core Supply Voltage | — | 1.5 V |
| Logic Family | — | CMOS |
| ऑपरेटिंग तापमान | — | -55C to +125C |
| SEU Immunity | — | SEU rate < 10-10 errors/bit-day; SEU-hardened registers |
| TMR Requirement | — | SEU-hardened registers eliminate need for triple-module redundancy |
| Derived From | — | Actel/Microsemi Axcelerator commercial family |
| Radiation TID | — | [DATA_NEEDED: total ionizing dose rating] |