RTAX4000SL-CQ352E vs RTAX4000SL-CQ352B तुलना
विस्तृत दोनों ओर की तुलना RTAX4000SL-CQ352E द्वारा Microsemi और RTAX4000SL-CQ352B द्वारा Microchip Technology. मुख्य विशेषताओं, इलेक्ट्रिकल पैरामीटर, पैकेजिंग, चक्र स्थिति, मूल्यांकन और उपलब्धता को तुलना करके अपनी डिजाइन की आवश्यकताओं के लिए सबसे अच्छा घटक निर्धारित करें。
Microsemi
RTAX4000SL-CQ352E - 4M-Gate Rad-Tolerant FPGA, 352-CQFP | Microchip
RTAX4000SL-CQ352E ✓ सक्रियMicrochip Technology
RTAX4000SL-CQ352B - 4M-Gate Rad-Tolerant FPGA CQFP-352 | Microchip
RTAX4000SL-CQ352B ✓ सक्रियविशेषता तुलना
| पैरामीटर | RTAX4000SL-CQ352E | RTAX4000SL-CQ352B |
|---|---|---|
| ब्रांड | Microsemi | Microchip Technology |
| श्रेणी | FPGA & CPLD | FPGA & CPLD |
| लाइफसाइकिल स्थिति | सक्रिय | सक्रिय |
| Family | RTAX-SL (RTAX-S/SL and RTAX-DSP) | RTAX-SL (Radiation-Tolerant FPGAs) |
| Equivalent System Gates | 4,000,000 | 4,000,000 |
| Logic Cells / Cells | 40,320 | — |
| Total Logic Modules | 60,480 | — |
| Process Technology | 0.15 um CMOS | 0.15 um |
| Core Supply Voltage | 1.5 V | — |
| पैकेज | 352-terminal CQFP (ceramic quad flat pack) | 352-Pin CQFP |
| Terminal Pitch | 0.500 mm | — |
| Radiation Tolerance | Radiation-tolerant (space-flight grade) | Radiation-tolerant (space flight qualified family) |
| Configuration | Anti-fuse, live at power-up, single-chip | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Clocking | Segmentable clocks, chip-wide highway routing | — |
| Arithmetic Support | Dedicated carry logic | Carry logic |
| ऑपरेटिंग तापमान | -55C to +125C | [DATA_NEEDED: Operating Temperature] |
| माउंटिंग प्रकार | Surface Mount | Surface Mount |
| Typical Applications | Space-flight systems, satellites | — |
| RoHS स्थिति | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS Status] |
| Logic Cells | — | 40,320 |
| Core Voltage | — | 1.5 V |
| Packaging / Shipping | — | Box |
| Programmable Type | — | FPGA |
| Clock Resources | — | Segmentable clocks, chip-wide highway routing |
| I/O Voltage | — | [DATA_NEEDED: I/O Voltage] |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID Rating] |
| Single Event Latch-up Threshold | — | [DATA_NEEDED: SEL LET Threshold] |