RTAX250SL-1CG624E vs RTAX250SL-1CG624V 比較
詳細な並列比較: RTAX250SL-1CG624E メーカー: Microchip Technology および RTAX250SL-1CG624V メーカー: Microchip Technology。主要仕様、電気的特性、パッケージ、ライフサイクルステータス、価格、在庫状況を比較して、設計要件に最適な部品を判断してください。
Microchip Technology
RTAX250SL-1CG624E - 250K Gate Rad-Tolerant FPGA, CCGA-624 | Microchip
RTAX250SL-1CG624E ✓ 生産中Microchip Technology
RTAX250SL-1CG624V - 250k-Gate Rad-Tolerant FPGA | Microchip
RTAX250SL-1CG624V ✓ 生産中仕様比較
| パラメータ | RTAX250SL-1CG624E | RTAX250SL-1CG624V |
|---|---|---|
| ブランド | Microchip Technology | Microchip Technology |
| カテゴリ | FPGA & CPLD | FPGA & CPLD |
| ライフサイクル状態 | 有効 | 有効 |
| 在庫状況 | In Stock | In Stock |
| 単価（USD） | $1.00 | $0.00 |
| Equivalent System Gates | 250,000 gates | — |
| Configurable Logic Blocks (CLBs) | 2816 | — |
| Logic Cells | 4224 | 4224 |
| User I/O | 248 inputs / 248 outputs | — |
| Core Supply Voltage | 1.5 V (1.425 V to 1.575 V) | 1.425 V to 1.575 V |
| Maximum Combinatorial Delay (CLB) | 0.93 ns | — |
| Maximum System Frequency | 649 MHz | — |
| Process Technology | 0.15 um CMOS | — |
| Logic Family | CMOS | — |
| パッケージ | 624-ball Ceramic Column Grid Array (CCGA-624) | 624-pin ceramic column grid array (CGA) |
| 動作温度 | -55C to +125C | — |
| Radiation Tolerance | SEU-immune to specified LET threshold; SEU rate < 10-10 errors/bit-day | Radiation-tolerant (space-flight) |
| SEU Mitigation | SEU-hardened registers (no external TMR required) | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | — |
| Configuration | Live-at-power-up, true single-chip operation | Live at power-up, single-chip |
| 実装タイプ | Surface Mount (ceramic column grid array) | Surface Mount |
| RoHS ステータス | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS Status] |
| I/O Supply Voltage | [DATA_NEEDED: I/O bank voltage] | — |
| Family | — | RTAX-S/SL Radiation-Tolerant FPGA |
| Equivalent Gates | — | 250000 gates |
| CLBs | — | 2816 |
| User I/O Inputs | — | 248 |
| User I/O Outputs | — | 248 |
| Technology | — | CMOS, antifuse |
| Speed Grade | — | -1 |
| 動作温度範囲 | — | [DATA_NEEDED: Operating Temperature Range] |
| SEU Characterization | — | SEU-optimized SL fabric generation |