RTAX4000SL-1CQ352B vs RTAX4000SL-CQ352B 比較
詳細な並列比較: RTAX4000SL-1CQ352B メーカー: Microchip Technology および RTAX4000SL-CQ352B メーカー: Microchip Technology。主要仕様、電気的特性、パッケージ、ライフサイクルステータス、価格、在庫状況を比較して、設計要件に最適な部品を判断してください。
Microchip Technology
RTAX4000SL-1CQ352B - 4M-Gate Rad-Tolerant FPGA CQFP-352 | Microchip
RTAX4000SL-1CQ352B ✓ 生産中Microchip Technology
RTAX4000SL-CQ352B - 4M-Gate Rad-Tolerant FPGA CQFP-352 | Microchip
RTAX4000SL-CQ352B ✓ 生産中仕様比較
| パラメータ | RTAX4000SL-1CQ352B | RTAX4000SL-CQ352B |
|---|---|---|
| ブランド | Microchip Technology | Microchip Technology |
| カテゴリ | FPGA & CPLD | FPGA & CPLD |
| ライフサイクル状態 | 有効 | 有効 |
| 在庫状況 | In Stock | In Stock |
| 単価（USD） | $0.00 | $1.00 |
| Family | RTAX-SL Radiation-Tolerant FPGA | RTAX-SL (Radiation-Tolerant FPGAs) |
| Equivalent System Gates | 4,000,000 gates | 4,000,000 |
| Logic Cells | 60,480 | 40,320 |
| CLBs (Clocked Logic Blocks) | 40,320 | — |
| Process Technology | 0.15 um | 0.15 um |
| Core Supply Voltage | 1.5 V | — |
| パッケージ | 352-Pin CQFP (ceramic quad flat pack) | 352-Pin CQFP |
| Speed Grade | -1 | — |
| Programming Technology | Anti-fuse, one-time programmable | — |
| Power-Up Behavior | Live at power-up (no external configuration device) | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Embedded SRAM with built-in FIFO control logic |
| Clock Features | Segmentable clocks, chip-wide resources | — |
| Radiation Tolerance | Radiation-tolerant, for space flight systems | Radiation-tolerant (space flight qualified family) |
| Base Architecture | Axcelerator (commercial) derived | — |
| 実装タイプ | Surface Mount | Surface Mount |
| 動作温度範囲 | [DATA_NEEDED: operating temperature range] | — |
| I/O Voltage | [DATA_NEEDED: I/O bank voltage range] | [DATA_NEEDED: I/O Voltage] |
| RoHS ステータス | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS Status] |
| Core Voltage | — | 1.5 V |
| Packaging / Shipping | — | Box |
| Programmable Type | — | FPGA |
| Clock Resources | — | Segmentable clocks, chip-wide highway routing |
| Arithmetic Support | — | Carry logic |
| 動作温度 | — | [DATA_NEEDED: Operating Temperature] |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID Rating] |
| Single Event Latch-up Threshold | — | [DATA_NEEDED: SEL LET Threshold] |