RTAX4000SL-1CQ352E vs RTAX1000SL-CQ352V 比較
詳細な並列比較: RTAX4000SL-1CQ352E メーカー: Microchip Technology および RTAX1000SL-CQ352V メーカー: Microchip Technology。主要仕様、電気的特性、パッケージ、ライフサイクルステータス、価格、在庫状況を比較して、設計要件に最適な部品を判断してください。
Microchip Technology
RTAX4000SL-1CQ352E - 4M-Gate Rad-Tolerant FPGA CQFP-352 | Microchip
RTAX4000SL-1CQ352E ✓ 生産中Microchip Technology
RTAX1000SL-CQ352V - 1M-Gate Rad-Tolerant FPGA | Microchip
RTAX1000SL-CQ352V ✓ 生産中仕様比較
| パラメータ | RTAX4000SL-1CQ352E | RTAX1000SL-CQ352V |
|---|---|---|
| ブランド | Microchip Technology | Microchip Technology |
| カテゴリ | FPGA & CPLD | FPGA & CPLD |
| ライフサイクル状態 | 有効 | 有効 |
| 在庫状況 | In Stock | In Stock |
| 単価（USD） | $3,840.00 | $0.00 |
| Family | RTAX-SL Radiation-Tolerant FPGA | RTAX-SL (RTAX-S/SL Radiation-Tolerant FPGAs) |
| Equivalent Gates | 4,000,000 | — |
| Logic Cells | 60,480 | 18,144 |
| CLBs | 40,320 | — |
| Process Technology | 0.15 um CMOS | 0.15 um CMOS |
| Core Supply Voltage | 1.5 V | — |
| パッケージ | 352-pin CQFP, 0.500 mm terminal pitch | 352-pin Ceramic CQFP (CQ352V) |
| 実装タイプ | Surface Mount | Surface Mount |
| 動作温度 | -55C to +125C (extended) | [DATA_NEEDED: operating temperature range] |
| Programmability | Antifuse, one-time programmable, live at power-up | — |
| Radiation Tolerance | Radiation-tolerant (space flight qualified family) | Radiation-tolerant, space-flight qualified family |
| Packaging | Box | — |
| カテゴリ | Programmable Logic Devices - FPGA | — |
| I/O Standard Support | [DATA_NEEDED: I/O standard list] | — |
| Embedded Memory | [DATA_NEEDED: embedded SRAM block capacity] | Embedded SRAM with built-in FIFO control logic |
| RoHS ステータス | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS compliance status] |
| MSLレベル | [DATA_NEEDED: MSL level] | [DATA_NEEDED: moisture sensitivity level] |
| Equivalent System Gates | — | 1,000,000 |
| CLBs (Logic Modules) | — | 12,096 |
| Maximum Toggle Frequency | — | 581 MHz |
| Core Voltage | — | 1.5 V |
| Programming Technology | — | Antifuse (one-time programmable) |
| Power-Up Behavior | — | Live at power-up (non-volatile) |
| Configuration Upset Immunity | — | No SEU in configuration memory (antifuse) |
| I/O Voltage | — | [DATA_NEEDED: I/O bank voltage range] |
| Total Ionizing Dose (TID) | — | [DATA_NEEDED: TID rating in krad (Si)] |
| Estimated Equivalent Gates per CLB | — | [DATA_NEEDED: gates-per-CLB ratio] |