EPM7064SLC44-10N - MAX 7000 64-Macro 36 I/O 10ns CPLD | Altera
部品番号: EPM7064SLC44-10N ✗ 生産終了| 数量 | 単価 | 小計 |
|---|---|---|
| 1 | $8.45 | $8.45 |
| 10 | $7.2 | $72.00 |
| 100 | $5.85 | $585.00 |
| 500 | $4.95 | $2,475.00 |
| 1,000 | $4.1 | $4,100.00 |
EPM7064SLC44-10N 概要
A CPLD (Complex Programmable Logic Device) is a non-volatile programmable logic IC that combines multiple PAL-like macro-cell logic blocks on a single die, connected through a programmable interconnect matrix. CPLDs sit in the hierarchy between simple PLDs (PALs/GALs) and FPGAs, offering deterministic, near-zero-power standby, instant-on configuration, and predictable timing — making them ideal for glue logic, bus interfacing, and control applications where FPGAs would be over-spec and PALs would lack capacity.
Key features include 5V CMOS core operation, four dedicated input pins that also serve as global clock/clear/Output Enable resources, programmable macro-cell flip-flops with individual clear, preset, clock, and enable control, and an extended IEEE-Standard 1149.1 boundary-scan test interface. Each user I/O can be configured per-pin for 3.3V or 5V PCI-compliant drive strength. The non-volatile EEPROM configuration cell means the device powers up instantly with no external boot PROM required.
Architecturally, the EPM7064SLC44-10N partitions its 64 macro cells into four Logic Array Blocks (LABs), each containing 16 macro cells, with a programmable interconnect array (PIA) that routes any signal to any destination. The 10 ns tPD (with the -10 speed grade suffix) supports counter frequencies up to 125 MHz, while higher-density MAX 7000A/S/AE variants in the same family scale to 256 macro cells and 5 ns timing.
Typical applications include bus decoding and address mapping in legacy 8051/68k designs, glue-logic integration for DSP/microprocessor systems, peripheral control (UART, SCSI, ISA bridge), state-machine implementation, and PCI bus interface glue. The wide 5V tolerance and 36 I/Os also suit industrial motor-control and instrumentation front ends.
When designing with this device, observe the 5V ±5% supply requirement, place a 0.1 µF decoupling capacitor close to each VCC/GND pair on the PLCC-44 footprint, and configure unused I/Os as outputs driving low to minimize power consumption. The JTAG chain should be bypassed with TCK held low during normal operation if boundary-scan is unused.
ドロップイン代替品: EPM7064SLC44-10N — 同一パッケージでピン互換。PCBの作り直しが必要な異なるパッケージの部品は除外されています。
クイック比較ツール — 並列比較する代替部品を選択:
EPM7064SLC44-10
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EPM7064SLC44-7
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EPM7064STC44-10N
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EPM7064SLC44-5
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EPM7064STC44-7N
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EPM7064SLC44-10N 最大定格＆電気的特性
| Family | MAX 7000 |
| Architecture | EEPROM-based CMOS, second-generation MAX |
| Macro Cells | 64 |
| Usable Gates | 1,250 |
| User I/Os | 36 |
| Propagation Delay (tPD) | 10 ns |
| Counter Frequency (max) | 125 MHz |
| 動作電源電圧 | 5 V (±5%) |
| Logic Family | CMOS |
| 動作温度 | 0°C to +70°C (commercial) |
| パッケージ | 44-pin PLCC (SLC) |
| 実装タイプ | Surface Mount |
| Programmable Logic Blocks (LABs) | 4 |
| In-System Programming | Yes (JTAG IEEE 1149.1) |
EPM7064SLC44-10N ピン構成
| ピン 1 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 2 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 3 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 4 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 5 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 6 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 7 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 8 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 9 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 10 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 11 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 12 | GND — Ground reference (per datasheet pinout) |
| ピン 13 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 14 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 15 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 16 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 17 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 18 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 19 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 20 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 21 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 22 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 23 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 24 | GND — Ground reference (per datasheet pinout) |
| ピン 25 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 26 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 27 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 28 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 29 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 30 | TDI — JTAG Test Data In (IEEE 1149.1 boundary scan) |
| ピン 31 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 32 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 33 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 34 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 35 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 36 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 37 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 38 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 39 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 40 | TMS — JTAG Test Mode Select (IEEE 1149.1 boundary scan) |
| ピン 41 | TCK — JTAG Test Clock (IEEE 1149.1 boundary scan) |
| ピン 42 | I/O — User I/O pin (macro cell input/output, programmable per-pin) |
| ピン 43 | VCC — +5V supply voltage (per datasheet pinout) |
| ピン 44 | TDO — JTAG Test Data Out (IEEE 1149.1 boundary scan) |
主な用途
EPM7064SLC44-10N の用途: 7 件s: Microprocessor Glue Logic and Address Decoding, PCI Bus Interface and Bridge Logic, DSP / Microprocessor Peripheral Control, Industrial Motor Control State Machine, Legacy ISA / VESA Local Bus Glue, SCSI and Parallel Port Peripheral Control, Test and Measurement Instrumentation Front End.
Microprocessor Glue Logic and Address Decoding
The EPM7064SLC44-10N is well suited for 8051, 68k, and legacy x86 microprocessor glue logic and address decoding because its 64 macro cells can decode full 24-bit address buses, generate chip-select and wait-state signals, and integrate scattered 74-series logic into one device. The 10 ns pin-to-pin propagation delay is fast enough to insert logic into the address-to-chip-select path without violating AC timing of memory or peripheral cycles. Compared with discrete 74HC/HCT decoder ICs, the CPLD consolidates dozens of packages into one PLCC-44, simplifying PCB layout and BOM cost. The 36 user I/Os comfortably handle an 8-bit data bus plus 16-bit address plus control signal glue.
おすすめ
PCI Bus Interface and Bridge Logic
The EPM7064SLC44-10N implements PCI bus target/initiator interfaces because each I/O supports 5V PCI-compliant drive strength with 3.3V or 5V signaling per the PCI Local Bus 2.3 standard. The 64 macro cells can encode parity, frame, IRDY, TRDY, and DEVSEL state machines, plus command decoding for configuration, I/O, and memory cycles. The 10 ns tPD and 125 MHz max counter rate satisfy the PCI 33 MHz clock domain timing budget. The JTAG boundary-scan interface per IEEE 1149.1 also enables board-level interconnect testing of PCI sockets and backplanes.
おすすめ
DSP / Microprocessor Peripheral Control
The EPM7064SLC44-10N provides peripheral glue in systems using TMS320, ADSP-21xx, or similar DSPs because its 64 macro cells can implement UART, SPI, I2C, McBSP, and DMA handshake controllers in a single device. The deterministic 10 ns tPD avoids the variability of software-based timing loops and produces glitch-free chip-select and ready signals. With 36 I/Os, designers can connect to multiple peripherals simultaneously while preserving DSP GPIO for application use. The 5V core voltage and 5V-tolerant I/Os also interface cleanly with legacy 5V peripheral ASICs.
おすすめ
Industrial Motor Control State Machine
The EPM7064SLC44-10N implements BLDC and stepper motor control state machines with deterministic timing because its macro-cell flip-flops support clear, preset, clock, and enable control on a per-cell basis. The 125 MHz counter rate and 10 ns tPD enable high-resolution PWM generation at 20 kHz to 100 kHz switching frequencies with sub-microsecond dead-time insertion. With 36 I/Os, the CPLD can drive 6 to 12 half-bridge gate-driver signals plus encoder, Hall-sensor, and fault-feedback inputs. The industrial-grade EPM7064STC44-10N variant adds -40 to +85C operation for outdoor motor drives and servo amplifiers.
おすすめ
Legacy ISA / VESA Local Bus Glue
The EPM7064SLC44-10N serves as glue logic for legacy ISA 8-bit/16-bit and VESA Local Bus (VLB) systems because its 5V-tolerant I/Os and 10 ns timing satisfy the ISA bus 8 MHz and VESA 33 MHz/40 MHz timing requirements. The CPLD can decode I/O port addresses, generate wait states, multiplex 16-bit data onto 8-bit peripherals, and arbitrate DMA channels. With 64 macro cells, designers can replace 4 to 8 separate 74LS/74F glue ICs with a single PLCC-44 package, reducing board area and improving signal integrity through shorter trace lengths.
おすすめ
SCSI and Parallel Port Peripheral Control
The EPM7064SLC44-10N implements SCSI-2 narrow bus termination control and parallel-port peripheral state machines because its 36 I/Os can handle 8-bit data plus REQ/ACK handshake, parity, and termination power control. The 64 macro cells can encode arbitration state machines, parity generators/checkers, and bus-mode multiplexers for SCSI-1/2/3 and Centronics/EPP/ECP parallel-port standards. Compared with PAL/GAL implementations, the CPLD offers in-system reprogrammability for field-upgradeable firmware without removing the device from the PCB.
おすすめ
Test and Measurement Instrumentation Front End
The EPM7064SLC44-10N functions as the front-end logic controller in test and measurement instruments such as digital multimeters, oscilloscope trigger circuits, and logic analyzers because its deterministic timing and 5V I/O tolerance interface directly with legacy measurement ASICs. The 36 I/Os handle range switching relays, multiplexer select lines, ADC channel sequencing, and display-driver strobes in one device. The 64 macro cells can also implement custom trigger sequences and pattern-matching state machines for protocol-aware triggering. Per the datasheet, the JTAG boundary-scan interface simplifies factory test of high-density instruments.
おすすめ
おすすめ製品の概要
エンジニアリング参考データ: EPM7064SLC44-10N — 比較、設計ガイダンス、コンプライアンス情報。
選定ガイド
代替品との比較
| パラメータ | この製品 | EPM7064SLC44-10 | EPM7064SLC44-7 | EPM7064STC44-10N | EPM7064SLC44-5 | EPM7064STC44-7N |
|---|---|---|---|---|---|---|
| Brand | Altera (Intel) | Altera (Intel) | Altera (Intel) | Altera (Intel) | Altera (Intel) | Altera (Intel) |
| Package | 44-pin PLCC (SLC) | 44-pin PLCC (SLC) | 44-pin PLCC (SLC) | 44-pin PLCC (STC) | 44-pin PLCC (SLC) | 44-pin PLCC (STC) |
| Macro Cells | 64 | 64 | 64 | 64 | 64 | 64 |
| Propagation Delay (tPD) | 10 ns | 10 ns | 7 ns | 10 ns | 5 ns | 7 ns |
| User I/Os | 36 | 36 | 36 | 36 | 36 | 36 |
| Operating Temperature | 0 to +70 C (commercial) | 0 to +70 C | 0 to +70 C | -40 to +85 C (industrial) | 0 to +70 C | -40 to +85 C (industrial) |
| Supply Voltage | 5 V | 5 V | 5 V | 5 V | 5 V | 5 V |
| Lifecycle Status | Obsolete | Obsolete | Obsolete | Obsolete | Obsolete | Obsolete |
主な差別化要因
- Drop-in compatibility across the entire MAX 7000 EPM7064 SLC44 family （vs EPM7064SLC44-10)
- Industrial temperature option with identical pinout （vs EPM7064STC44-10N)
- Higher-speed drop-in alternative reduces timing margin by 30-50% （vs EPM7064SLC44-7)
設計ノート
Estimated: ICC vs frequency for EPM7064SLC44-10N: Icc_typ = ~50 mA standby (VCC=5V, no outputs toggling) plus ~1 mA per MHz per switching I/O. For a design with 36 I/Os averaging 5 MHz toggle frequency, budget 230 mA from the 5V rail. Place a 0.1 µF ceramic decoupling capacitor within 5 mm of every VCC/GND pair (pins 12, 24, 43) and a single 10 µF tantalum bulk capacitor on the PLCC-44 footprint supply trace. In-system programming via JTAG requires VCC to remain stable at 5V ±5% during IEEE 1149.1 configuration pulses.
The 44-pin PLCC socket (JEDEC MS-018) should use a low-profile through-hole or surface-mount PLCC-44 socket with tin or gold-plated contacts. Per the application note AN-70, keep all I/O trace lengths below 50 mm on a 4-layer PCB to limit transmission-line effects at 5V CMOS edge rates. Each I/O pin is rated 25 mA sink/source per JEDEC standard, so shared fan-out is typically < 5 LS-TTL loads. Unused I/Os should be configured as outputs driving low in the Quartus/MAX+PLUS II design file to minimize dynamic current during operation.
Three common pitfalls when designing with the EPM7064SLC44-10N: (1) exceeding 5V ±5% on VCC, which triggers EEPROM over-stress and reduces data retention below the 20-year specification; (2) leaving JTAG TCK floating during operation, which can inadvertently trigger JTAG state-machine transitions - tie TCK to GND through a 10 kΩ pull-down if JTAG is unused; (3) hot-plugging the PLCC socket while VCC is active, which can cause latch-up through the I/O ESD cells. Per the datasheet absolute maximum ratings, VCC must ramp monotonically from 0V to 5V in less than 100 ms at power-on.
コンプライアンス情報
Lead-free per 'N' suffix (Pb-free terminal finish) per JEDEC J-STD-609. RoHS compliance inferred from N suffix; specific REACH and halogen-free status not directly stated in available web data - set to unknown per data authenticity rules.
