EPF10K100EFC484-1X vs EPF10K100EFC484-1 Pengandingan
Pengandingan Sisi Kiri Sisi Kanan Terperinci EPF10K100EFC484-1X disebabkan oleh Intel dan EPF10K100EFC484-1 disebabkan oleh Intel. Bandingkan spesifikasi utama, parameter elektrik, pakej, status kehidupan, harga, dan keupayaan untuk menentukan komponen terbaik untuk keperluan disenjaya anda.
Pengandingan Spesifikasi
| Parametr | EPF10K100EFC484-1X | EPF10K100EFC484-1 |
|---|---|---|
| Merek | Intel | Intel |
| Kategori | FPGA & CPLD | FPGA & CPLD |
| Status Lingkungan Hidup | NRND | Aktif |
| Harga Unit (USD) | — | $142.00 |
| Family | FLEX 10KE | FLEX 10KE |
| Series | FLEX-10KE® | — |
| Logic Elements / Cells | 4992 | 4,992 |
| System Gates | 100,000 | — |
| Logic Array Blocks (LABs) | 624 | — |
| Total RAM Bits | 49,152 | 49,152 |
| User I/O Count | 338 | — |
| Number of I/O Pins | 338 (package provides up to 488 bonded I/O pads) | — |
| Supply Voltage (Core) | 2.5 V (2.375 V – 2.625 V) | — |
| Supply Voltage (I/O) | 3.3 V | — |
| Process Technology | 0.22 µm CMOS | 0.42 µm CMOS |
| Maximum Internal Frequency | 333.33 MHz | — |
| Propagation Delay | 0.6 ns (per logic element, typical) | 0.6 ns |
| Kemasan | 484-FBGA (FineLine BGA, 23 × 23 mm) | 484-FBGA (FineLine BGA, 23×23 mm) |
| Suhu Operasi | 0 °C to +70 °C (commercial) | 0 °C to 70 °C (commercial) |
| Jenis Pemasangan | Surface Mount | Surface Mount (SMT) |
| Programming Interface | JTAG / serial (ByteBlaster-compatible) | — |
| Status RoHS | [DATA_NEEDED: RoHS status] | Non-compliant (per Arrow listing) |
| Number of LABs/CLBs | — | 624 |
| Embedded Memory (Kbits) | — | 48 (12 EABs) |
| Number of Block RAM (EABs) | — | 12 |
| User I/Os | — | 338 |
| Total Gates | — | 257,000 typical system gates |
| Operating Supply Voltage (Core) | — | 2.5 V |
| Operating Supply Voltage Range | — | 2.375 V to 2.625 V |
| Program Memory Type | — | SRAM (volatile) |
| Configuration Interface | — | JTAG (IEEE 1149.1), serial/parallel EPROM |
| PCI Support | — | 3.3 V PCI compliant |
| Status Lingkungan Hidup | — | Obsolete (EOL) |