EPF8820ARC208-2 vs EPF8820ARC208-3 Comparação
Comparação detalhada lado a lado de EPF8820ARC208-2 por Altera e EPF8820ARC208-3 por Intel. Compare especificações principais, parâmetros elétricos, encapsulamento, status do ciclo de vida, preços e disponibilidade para determinar o melhor componente para os requisitos do seu projeto.
Intel
EPF8820ARC208-3 - FLEX 8000 FPGA, 8K Gates, 672 Cells | Intel / Altera
EPF8820ARC208-3 ObsoleteComparação de especificações
| Parâmetro | EPF8820ARC208-2 | EPF8820ARC208-3 |
|---|---|---|
| Marca | Altera | Intel |
| Categoria | FPGA & CPLD | FPGA & CPLD |
| Status do ciclo de vida | Obsolete | Obsolete |
| Status do estoque | In Stock | In Stock |
| Preço unitário (USD) | $17,95 | $62,00 |
| Family | FLEX 8000 | FLEX 8000 (EPF8820) |
| Logic Cells | 672 | — |
| Usable Gates | 8,000 (typical) | 8,000 |
| Registers | 1,500 (max) | 152 |
| User I/O Pins | 152 | — |
| Encapsulamento | 208-pin RQFP / BFQFP with exposed pad | — |
| Process Technology | 0.42 µm CMOS | 0.42 µm CMOS |
| Supply Voltage (Core) | 5 V | — |
| I/O Voltage (MultiVolt) | 3.3 V or 5.0 V | — |
| Speed Grade | -2 | — |
| Max Internal Frequency | 125 MHz | — |
| Configuration Method | SRAM - serial EPC device, parallel EPROM, or microcontroller | — |
| In-Circuit Reconfigurable | Yes (ICR) | — |
| Boundary-Scan / JTAG | Yes | — |
| Temperatura de operação | Commercial (0 °C to +70 °C) | — |
| Tipo de montagem | Surface Mount | Surface Mount |
| Status RoHS | [DATA_NEEDED: rohs_status] | [DATA_NEEDED: RoHS status] |
| Series | — | FLEX 8000 |
| Logic Cells / Elements | — | 672 |
| Maximum Operating Frequency | — | 125 MHz |
| Supply Voltage (VCC) | — | 4.75 V to 5.25 V |
| Configuration Memory | — | SRAM (volatile) |
| Encapsulamento / Caixa | — | 208-BFQFP Exposed Pad (208-RQFP, 28x28 mm) |
| Supplier Device Package | — | 208-RQFP (28x28) |
| Packaging | — | Tray |
| Faixa de temperatura de operação | — | [DATA_NEEDED: operating temperature range] |
| In-Circuit Reconfigurability (ICR) | — | Yes (via external configuration devices) |
| Boundary-Scan Test | — | JTAG (IEEE 1149.1) |
| I/O Tolerance | — | 3.3 V / 5 V |
| Clock Networks | — | 4 dedicated low-skew global clocks |
| Lead-Free / Finish | — | [DATA_NEEDED: lead-free finish] |