EPM9480RC240-20 vs EPM9560R1208-20 Сравнение
Подробное сравнение бок о бок EPM9480RC240-20 от Altera и EPM9560R1208-20 от Altera. Сравните ключевые характеристики, электрические параметры, упаковку, статус жизненного цикла, цены и наличие, чтобы выбрать лучший компонент для ваших требований.
Сравнение характеристик
| Параметр | EPM9480RC240-20 | EPM9560R1208-20 |
|---|---|---|
| Бренд | Altera | Altera |
| Категория | FPGA & CPLD | FPGA & CPLD |
| Статус жизненного цикла | NRND | Obsolete |
| Наличие | In Stock | In Stock |
| Цена за единицу (USD) | $8,40 | $22,40 |
| Family | MAX 9000 | MAX 9000 |
| Device Type | CPLD (Complex Programmable Logic Device) | CPLD (Complex Programmable Logic Device) |
| Macrocells | 480 | 560 |
| Usable Gates | 10,000 | 6,000 |
| Logic Elements | 30 | — |
| User I/O Pins | 175 | — |
| Number of Terminals | 240 | — |
| Корпус | 240-RQFP (32x32 mm, FQFP, Gull Wing) | R-1208 (BGA-style fine-pitch) |
| Maximum Propagation Delay (tpd) | 20 ns | — |
| Maximum Internal Frequency (fMAX, related -C variant) | 100 MHz | — |
| Programmable Flip-Flops (family) | 676 | — |
| Internal Supply Voltage | 4.75 V to 5.25 V | — |
| I/O Signaling Levels | 3.3 V or 5 V (configurable) | — |
| Process Technology | CMOS EEPROM | CMOS EEPROM, third-generation MAX architecture |
| Programming Interface | In-System Programmable (ISP) via IEEE 1149.1 JTAG | — |
| Operating Temperature Grade | Commercial | — |
| Terminal Form | Gull Wing | — |
| Статус RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: confirm via current distributor data] |
| Logic Array Blocks | — | 52 (typical for 560 macrocells) |
| Maximum User I/O | — | 212 |
| Propagation Delay (tPD) | — | 20 ns |
| Maximum Frequency (fMAX) | — | 125 MHz |
| Supply Voltage (VCCINT/VCCIO) | — | 5.0 V |
| Technology | — | CMOS EEPROM |
| In-System Programmability | — | Yes (IEEE 1149.1 JTAG) |
| Рабочая температура | — | 0C to +70C (commercial) |
| Тип монтажа | — | Surface Mount |
| Architecture | — | Multiple Array MatriX (MAX) with Logic Array Blocks (LABs) and Programmable Interconnect Array (PIA) |
| Boundary-Scan Test | — | JTAG IEEE Std. 1149.1 |
| Configuration Memory | — | On-chip EEPROM (non-volatile) |