TMS320F2812PGFA vs TMS320F2812 Сравнение
Подробное сравнение бок о бок TMS320F2812PGFA от Texas Instruments и TMS320F2812 от Texas Instruments. Сравните ключевые характеристики, электрические параметры, упаковку, статус жизненного цикла, цены и наличие, чтобы выбрать лучший компонент для ваших требований.
Texas Instruments
TMS320F2812PGFA - 32-Bit 150MHz C2000 MCU | Texas Instruments
TMS320F2812PGFA ✓ АктивенTexas Instruments
TMS320F2812 - 150MHz C2000 DSP, 256KB Flash | TI | Motor Control
TMS320F2812 ✓ АктивенСравнение характеристик
| Параметр | TMS320F2812PGFA | TMS320F2812 |
|---|---|---|
| Бренд | Texas Instruments | Texas Instruments |
| Категория | Microcontrollers | Microcontrollers |
| Статус жизненного цикла | Активен | Активен |
| Наличие | In Stock | In Stock |
| Цена за единицу (USD) | $7,60 | $15,30 |
| Core Processor | C28x Fixed-Point (C2000) | C2000 C28x 32-bit fixed-point |
| Core Size | 32-Bit | — |
| Максимальная тактовая частота | 150 MHz | 150 MHz (6.67 ns cycle time) |
| Program Memory Type | FLASH | — |
| Program Memory Size | 256KB (128K x 16) | — |
| Корпус | 176-LQFP (24x24 mm) | 176-pin LQFP (24 x 24 mm) |
| Тип монтажа | Surface Mount | Surface Mount |
| Peripherals | EMIF, Event Manager (PWM), CAN, SCI, SPI | — |
| Number of I/O | 56 | — |
| Series | C2000 C28x Fixed-Point | — |
| Product Status | Active | — |
| Core Supply Voltage | [DATA_NEEDED: Core Supply Voltage] | 1.8 V at 135 MHz; 1.9 V at 150 MHz |
| I/O Supply Voltage | [DATA_NEEDED: I/O Supply Voltage] | 3.3 V |
| Диапазон рабочих температур | [DATA_NEEDED: Operating Temperature Range] | [DATA_NEEDED: operating temperature range] |
| Packaging | Tray | — |
| Статус RoHS | [DATA_NEEDED: RoHS Status] | [DATA_NEEDED: RoHS status] |
| Flash Memory | — | 256 KB (128K x 16) |
| SRAM | — | 36 KB |
| External Memory Interface | — | EMIF |
| ADC Resolution | — | 12-bit |
| PWM Channels | — | Up to 16 via two event managers (EVA/EVB) |
| Serial Interfaces | — | SCI, SPI, CAN |
| Timers | — | Multiple general-purpose timers |
| Debug / Test | — | JTAG boundary scan per IEEE Standard 1149.1-1990 |
| Flash Sector Organization | — | 4 x 8K x 16 sectors and 6 x 16K x 16 sectors |
| Process Technology | — | High-performance static CMOS |