EP1K100EFI484-2 vs EP1K100FI484-2N Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP1K100EFI484-2 sa pamamagitan ng Intel at EP1K100FI484-2N sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP1K100EFI484-2 | EP1K100FI484-2N |
|---|---|---|
| Brand | Intel | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Aktibo | Obsolete |
| Family | ACEX-1K | — |
| Part Number | EP1K100EFI484-2 | — |
| Manufacturer | Intel (formerly Altera) | Intel (formerly Altera) |
| Typical Gates | 100,000 | — |
| Logic Elements | 49,152 | — |
| Logic Cells | 4,992 (typical) | — |
| Total RAM Bits | 49,152 | 49,152 |
| Number of EABs | 12 | — |
| Bits per EAB | 4,096 | — |
| Maximum User I/O | 333 | — |
| Core Voltage (VCCINT) | 2.5 V | — |
| I/O Voltage (VCCIO) | 3.3 V | — |
| Temperature na Operasyon | -40C to +85C (Industrial) | -40C to +85C (Industrial) |
| Speed Grade | -2 | -2 |
| Packhaging | 484-BBGA (FineLine BGA) | — |
| Uri ng Pagpapasok | Surface Mount | Surface Mount |
| Level ng MSL | 3 (168 Hours) | — |
| Process Technology | 0.18 umm SRAM | — |
| Configuration Method | JTAG / Passive Serial (volatile SRAM) | SRAM - Serial / JTAG |
| Tindminan RoHS | [DATA_NEEDED: RoHS status] | non_compliant (contains lead, BGA) |
| Series | — | ACEX-1K |
| Logic Elements / Cells | — | 4,992 |
| Number of Gates | — | 257,000 (typical 100,000) |
| Number of Logic Array Blocks (LABs) | — | 624 |
| Number of I/O | — | 333 |
| Number of Embedded Array Blocks (EABs) | — | 12 |
| Supply Voltage - Core (VCCINT) | — | 2.375 V to 2.625 V (2.5 V nominal) |
| Packhaging / Kaso | — | 484-FBGA (FineLine BGA, 23 mm x 23 mm) |
| Supplier Device Package | — | 484-FBGA |