EP1K100EFI484-2 vs EP1K100FI4842 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP1K100EFI484-2 sa pamamagitan ng Intel at EP1K100FI4842 sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP1K100EFI484-2 | EP1K100FI4842 |
|---|---|---|
| Brand | Intel | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Aktibo | Obsolete |
| Family | ACEX-1K | ACEX-1K |
| Part Number | EP1K100EFI484-2 | — |
| Manufacturer | Intel (formerly Altera) | — |
| Typical Gates | 100,000 | — |
| Logic Elements | 49,152 | 4,992 |
| Logic Cells | 4,992 (typical) | — |
| Total RAM Bits | 49,152 | 49,152 |
| Number of EABs | 12 | 6 |
| Bits per EAB | 4,096 | — |
| Maximum User I/O | 333 | — |
| Core Voltage (VCCINT) | 2.5 V | — |
| I/O Voltage (VCCIO) | 3.3 V | — |
| Temperature na Operasyon | -40C to +85C (Industrial) | -40C to +85C (Industrial) |
| Speed Grade | -2 | — |
| Packhaging | 484-BBGA (FineLine BGA) | 484-FBGA (FineLine BGA) |
| Uri ng Pagpapasok | Surface Mount | — |
| Level ng MSL | 3 (168 Hours) | — |
| Process Technology | 0.18 umm SRAM | 0.18 um CMOS SRAM |
| Configuration Method | JTAG / Passive Serial (volatile SRAM) | Passive Serial / Byte-Wide Parallel via JTAG |
| Tindminan RoHS | [DATA_NEEDED: RoHS status] | Compliant |
| System Gates | — | 100,000 |
| Number of LABs | — | 624 |
| User I/O Pins | — | 333 |
| Core Voltage | — | 2.5 V |
| I/O Standards | — | MultiVolt (2.5V / 3.3V / 5.0V) |
| Internal Performance | — | up to 250 MHz |
| JTAG Boundary Scan | — | IEEE 1149.1 compliant |