EP1K100FC484-3N vs EP1K100FC4842N Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP1K100FC484-3N sa pamamagitan ng Intel at EP1K100FC4842N sa pamamagitan ng Altera. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP1K100FC484-3N | EP1K100FC4842N |
|---|---|---|
| Brand | Intel | Altera |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Huling Pagbili | Obsolete |
| Presyo ng Yunit (USD) | $65.10 | — |
| Family | ACEX 1K | ACEX-1K Programmable Logic Device Family |
| Logic Elements | 4,992 | 4,992 |
| Typical Gate Count | 100,000 gates | — |
| Logic Array Blocks (LABs) | 624 | — |
| Embedded Array Blocks (EABs) | 12 | — |
| Total RAM Bits | 49,152 | — |
| User I/Os | 333 | — |
| Operating Voltage (VCCINT) | 2.5 V | — |
| Process Technology | 0.22 µm CMOS | 0.18 µm CMOS, SRAM-based |
| Internal Operating Frequency | up to 200 MHz | — |
| Speed Grade | -3 | -2 |
| Packhaging | 484-ball FBGA | — |
| Uri ng Pagpapasok | Surface Mount | Surface Mount |
| Configuration Method | Passive Serial, JTAG, PPA | SRAM / passive serial / JTAG |
| I/O Standards Supported | LVTTL, LVCMOS, PCI, 2.5V/3.3V/5V multiVolt I/O | — |
| Operating Temperature (Commercial) | 0 °C to +70 °C | — |
| Boundary-Scan Test | IEEE 1149.1 (JTAG) | — |
| Tindminan RoHS | [DATA_NEEDED: RoHS status] | — |
| Series | — | ACEX-1K |
| Typical Gates | — | 100,000 |
| Embedded Memory (EAB) | — | 49,152 bits |
| Number of LABs/CLBs | — | 624 |
| Number of I/O | — | 333 |
| Number of EABs | — | 12 |
| Voltage - Core | — | 2.5 V |
| Voltage - I/O | — | 2.5 V / 3.3 V / 5.0 V (multi-volt I/O) |
| Temperature na Operasyon | — | 0C to +70C (commercial) |
| Packhaging / Kaso | — | 484-BBGA |
| JTAG (IEEE 1149.1) | — | Yes (boundary-scan) |
| PCI Compliance | — | 66 MHz |