EP1K10TC100-2 vs EP1K10TC100-1N Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP1K10TC100-2 sa pamamagitan ng Intel at EP1K10TC100-1N sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP1K10TC100-2 | EP1K10TC100-1N |
|---|---|---|
| Brand | Intel | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Family | ACEX-1K | ACEX-1K |
| Device Type | FPGA (Field Programmable Gate Array) | — |
| Logic Elements / Cells | 576 | 576 |
| Number of Logic Array Blocks (LABs/CLBs) | 72 | — |
| Total RAM Bits | 12288 | — |
| Number of Gates | 10000 (typical); 56000 (maximum) | — |
| Number of User I/O | 66 | — |
| Number of I/O Banks | [DATA_NEEDED: number of I/O banks] | — |
| Pin-to-Pin Logic Delay | 0.5 ns | — |
| Maximum Internal Frequency | 200 MHz (per FPGAkey listing) | — |
| Process Technology | 0.22 μm CMOS | 0.22 µm CMOS SRAM |
| Core Supply Voltage (VCCINT) | 2.375 V to 2.625 V (2.5 V nominal) | — |
| I/O Supply Voltage (VCCIO) | [DATA_NEEDED: VCCIO range] | — |
| Temperature na Operasyon | 0 °C to 70 °C (TA, commercial) | 0 °C to 70 °C (commercial) |
| Packhaging | 100-pin TQFP (TQFP-100) | 100-pin TQFP (14 mm x 14 mm, 1 mm height) |
| Uri ng Pagpapasok | Surface Mount | Surface Mount (gull-wing) |
| Configuration Method | SRAM, serial / JTAG (IEEE 1149.1) | SRAM (external PROM required) |
| Tindminan RoHS | Compliant (per Heisener / DigiKey listings) | Compliant |
| Lead-Free | Yes | — |
| Series | — | EP1K10 |
| Total Gates (typical) | — | 10,000 |
| Embedded RAM Bits | — | 12,288 bits |
| Logic Array Blocks (LABs) | — | 72 |
| Embedded Array Blocks (EABs) | — | 3 x 4 Kbit |
| User I/Os | — | 66 |
| Core Supply Voltage | — | 2.5 V (2.375 V to 2.625 V) |
| Speed Grade | — | -1N (commercial, slower tier) |
| JTAG Support | — | Yes (IEEE 1149.1 boundary-scan) |