EP1K30QC208-1 vs EP1K100QC208-1 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP1K30QC208-1 sa pamamagitan ng Intel at EP1K100QC208-1 sa pamamagitan ng Altera. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP1K30QC208-1 | EP1K100QC208-1 |
|---|---|---|
| Brand | Intel | Altera |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Device Family | ACEX-1K | — |
| Logic Elements (LEs) | 1,728 | 4992 |
| Equivalent Gates | 30,000 | — |
| Logic Array Blocks (LABs) | 216 | 624 |
| Embedded Memory (EAB) | 24,576 bits | — |
| Maximum User I/O | 147 | — |
| Core Supply Voltage (VCCINT) | 2.5 V (2.375 V to 2.625 V) | — |
| Packhaging | 208-BFQFP (Plastic Quad Flat Pack, PQFP208) | — |
| Terminal Pitch | 0.500 mm | — |
| Uri ng Pagpapasok | Surface Mount (gull-wing leads) | Surface Mount |
| Temperature na Operasyon | 0 °C to +70 °C (commercial) | — |
| Maximum Operating Frequency | up to 250 MHz (family typical) | — |
| Process Technology | 2.5 V CMOS | 0.22 µm |
| Configuration Method | SRAM, in-system reconfigurable (volatile) | Passive Serial / Passive Parallel Synchronous, JTAG |
| Boundary-Scan Test | JTAG IEEE 1149.1 | — |
| I/O Voltage Support | 2.5 V / 3.3 V (multi-volt I/O) | — |
| Configuration Device Support | EPC2, EPC4, EPC8 Enhanced Configuration Devices | — |
| Tindminan RoHS | Compliant (lead-free) | unknown |
| Family | — | ACEX-1K |
| Series | — | ACEX 1K |
| Maximum User I/O Pins | — | 147 |
| Embedded Memory Bits | — | 49152 |
| Number of RAM Blocks | — | Dual-port EAB array |
| Core Supply Voltage | — | 2.5 V |
| Internal Performance | — | 333.33 MHz |
| Number of Logic Gates | — | 100000 |
| Package Type | — | 208-BFQFP (PQFP-208) |
| Operating Temperature Grade | — | Commercial (C) |
| Speed Grade | — | -1 |