EP1K30TC144-1N vs EP1K10TC100-1N Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EP1K30TC144-1N sa pamamagitan ng Altera at EP1K10TC100-1N sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EP1K30TC144-1N | EP1K10TC100-1N |
|---|---|---|
| Brand | Altera | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Series | ACEX-1K | EP1K10 |
| Number of Logic Elements (LEs) | 1,728 | — |
| Typical Gates | 30,000 | — |
| Number of Logic Array Blocks (LABs) | 216 | — |
| Embedded Memory (EAB) | 24,576 bits (6 EABs) | — |
| Number of User I/O | 102 | — |
| Number of I/O Banks | 4 | — |
| Package Type | 144-LQFP (TQFP) | — |
| Uri ng Pagpapasok | Surface Mount | Surface Mount (gull-wing) |
| Core Voltage | 2.5 V | — |
| I/O Voltage | 3.3 V (LVCMOS/LVTTL); 2.5 V tolerant | — |
| Temperature na Operasyon | [DATA_NEEDED: operating temperature range] | 0 °C to 70 °C (commercial) |
| Process Technology | 0.18 µm SRAM | 0.22 µm CMOS SRAM |
| Configuration | SRAM-based, JTAG (IEEE 1149.1) + serial/parallel passive | — |
| PLLs | 6 (per device family) | — |
| Tindminan RoHS | [DATA_NEEDED: RoHS compliance status] | Compliant |
| Lead-Free | [DATA_NEEDED: lead-free status] | — |
| Level ng MSL | [DATA_NEEDED: MSL moisture sensitivity level] | — |
| Family | — | ACEX-1K |
| Logic Elements / Cells | — | 576 |
| Total Gates (typical) | — | 10,000 |
| Embedded RAM Bits | — | 12,288 bits |
| Logic Array Blocks (LABs) | — | 72 |
| Embedded Array Blocks (EABs) | — | 3 x 4 Kbit |
| User I/Os | — | 66 |
| Core Supply Voltage | — | 2.5 V (2.375 V to 2.625 V) |
| Packhaging | — | 100-pin TQFP (14 mm x 14 mm, 1 mm height) |
| Speed Grade | — | -1N (commercial, slower tier) |
| Configuration Method | — | SRAM (external PROM required) |
| JTAG Support | — | Yes (IEEE 1149.1 boundary-scan) |