EPC1PC8 vs EPC1PC8N Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPC1PC8 sa pamamagitan ng Altera at EPC1PC8N sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EPC1PC8 | EPC1PC8N |
|---|---|---|
| Brand | Altera | Intel |
| Kategorya | Memory ICs | Memory ICs |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Uri ng Memory | OTP Configuration PROM (Non-volatile) | OTP (One-Time Programmable) Configuration PROM |
| Laki ng Memory | 1 Mbit (1,048,576 bits) | 1 Mbit |
| Supply Voltage (VCC) | 5.0 V (typical) | — |
| Configuration Interface | Altera proprietary serial (DATA, DCLK, OE, nCS) | — |
| Programmability | One-Time Programmable (OTP) | In-system via JTAG; OTP after programming |
| Packhaging | 8-pin PDIP (8-PDIP, 300 mil) | 8-pin PDIP (PC8N suffix) |
| Uri ng Pagpapasok | Through-Hole (THT) | Through-Hole |
| Target FPGAs | ACEX 1K, APEX 20K/20KE/20KC, FLEX 10K/10KE/10KA, FLEX 6000/A | — |
| Pin Pitch | 2.54 mm (0.100 in) | — |
| Temperature na Operasyon | 0 C to +70 C (commercial) [DATA_NEEDED: full min/max range] | [DATA_NEEDED: operating temperature range C] |
| Programming Hardware | Altera MasterBlaster / ByteBlaster (legacy programmer) | — |
| Configuration Mode | Serial (1-bit data, 1-bit clock) | Serial (PS mode) |
| Tindminan RoHS | [DATA_NEEDED: RoHS compliance status] | Compliant (PC8N suffix indicates lead-free) |
| Lead-Free | [DATA_NEEDED: lead-free / SnPb plating] | — |
| Level ng MSL | [DATA_NEEDED: moisture sensitivity level] | — |
| Organisasyon | — | Serial (DCLK + DATA) |
| Volte ng Pagbibigay | — | 3.0 V to 3.6 V |
| Supply Voltage (Typical) | — | 3.3 V |
| Interface | — | Altera PS Serial / JTAG (IEEE 1149.1) |
| Standby Current | — | [DATA_NEEDED: standby current uA] |
| Active Current | — | [DATA_NEEDED: active current mA] |
| JTAG Compliance | — | IEEE Std. 1149.1-1990 boundary-scan |