EPF10K50VRI240-4N vs EPF10K30RC240-3 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPF10K50VRI240-4N sa pamamagitan ng Altera at EPF10K30RC240-3 sa pamamagitan ng Altera. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EPF10K50VRI240-4N | EPF10K30RC240-3 |
|---|---|---|
| Brand | Altera | Altera |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | NRND | Obsolete |
| Series | FLEX 10K | — |
| Family | FLEX 10K (Altera) | FLEX 10K |
| Logic Elements / Cells | 2880 | — |
| Total RAM Bits | 20480 | 12,288 |
| Typical Gate Count | 50000 gates | — |
| Number of LABs/CLBs | 360 | — |
| Number of Logic Elements | [DATA_NEEDED: logic element breakdown per LAB] | — |
| Number of EABs | 10 | — |
| User I/O Pins | 189 | 189 |
| Core Supply Voltage (VCCINT) | 3.0 V to 3.6 V (nominal 3.3 V) | — |
| I/O Supply Voltage (VCCIO) | 2.5 V / 3.3 V / 5.0 V compatible | — |
| Maximum Internal Frequency | 125 MHz | 125 MHz (speed grade -3) |
| Internal PLL Reference | 66.67 MHz | — |
| Process Technology | 0.42 µm CMOS, SRAM-based | 0.42 um CMOS, SRAM-based |
| Propagation Delay | 0.6 ns | 0.6 ns typical |
| Hanay ng Temperature na Operasyon | -40 °C to +85 °C (industrial) | — |
| Packhaging | 240-BFQFP / RQFP, exposed pad | 240-RQFP / 240-BFQFP Exposed Pad |
| Uri ng Pagpapasok | Surface Mount | Surface Mount |
| Configuration Interface | JTAG (IEEE 1149.1), ByteBlasterMV, BitBlaster | — |
| Speed Grade | -4 | — |
| Tindminan RoHS | Compliant (lead-free RQFP variant) | Contains lead (non-RoHS) |
| Typical Gates | — | 30,000 |
| Logic Elements (LEs) | — | 1,728 |
| Logic Array Blocks (LABs) | — | 216 |
| Embedded Array Blocks (EABs) | — | 6 |
| Core Supply Voltage | — | 5.0 V (VCCINT) |
| I/O Supply Voltage | — | 3.3 V or 5.0 V (multiVolt I/O) |
| Temperature na Operasyon | — | 0C to +70C (Commercial) |
| Configuration Method | — | Serial / parallel PROM, JTAG |
| JTAG Support | — | Yes (IEEE 1149.1 boundary scan) |