EPF6024AQC208-3N vs EPF6024AQC208-2N Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPF6024AQC208-3N sa pamamagitan ng Intel at EPF6024AQC208-2N sa pamamagitan ng Intel. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Intel
EPF6024AQC208-2N - FLEX 6000 24K-Gate FPGA, 171 I/O, PQFP-208
EPF6024AQC208-2N ⚠ Huling PagbiliPagsanggunian na paghahambing
| Parametro | EPF6024AQC208-3N | EPF6024AQC208-2N |
|---|---|---|
| Brand | Intel | Intel |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Huling Pagbili |
| Family | FLEX 6000 | FLEX 6000 |
| Typical Gates | 24,000 | 24,000 |
| Usable Gates | 19,000 | 19,000 |
| Logic Elements (LEs) | 1,960 | — |
| Logic Array Blocks (LABs) | 196 | 196 |
| User I/Os | 171 | — |
| Maximum Internal Frequency | 142.86 MHz | 166.67 MHz (speed grade -2) |
| Process Technology | 0.42 µm CMOS SRAM | 0.42 µm CMOS |
| Supply Voltage (VCCINT) | 3.3 V | 3.3 V (3.0 V to 3.6 V) |
| I/O Supply Voltage (VCCIO) | 3.3 V | — |
| Packhaging | 208-pin PQFP (BFQFP) | 208-pin PQFP (BFQFP) |
| Uri ng Pagpapasok | Surface Mount | Surface Mount |
| Configuration Method | SRAM (serial ByteBlaster / BitBlaster) | SRAM, via EPC1/EPC2 EPROM or ByteBlaster/BitBlaster |
| JTAG / Boundary Scan | IEEE 1149.1 compliant | — |
| Temperature na Operasyon | 0 °C to +85 °C (commercial) | 0 °C to +85 °C (commercial) |
| Speed Grade | -3 (slower) | — |
| Lead-Free / RoHS | Yes (N suffix) | Lead-free (Pb-free suffix "N") |
| Device Type | — | FPGA (SRAM-based) |
| Logic Elements (Cells) | — | 1,960 |
| Maximum User I/Os | — | 171 |
| JTAG Boundary Scan | — | IEEE 1149.1 compliant |