EPF8282ATI100-3N vs EPF8282ATI100-3NGZ Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPF8282ATI100-3N sa pamamagitan ng Altera at EPF8282ATI100-3NGZ sa pamamagitan ng Altera. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Pagsanggunian na paghahambing
| Parametro | EPF8282ATI100-3N | EPF8282ATI100-3NGZ |
|---|---|---|
| Brand | Altera | Altera |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Family | FLEX 8000 | FLEX 8000 |
| Logic Cells | 208 | — |
| Logic Array Blocks (LABs) | 26 | 26 |
| Usable Gates | 2,500 | ~2,500 |
| User I/Os | 78 | 78 |
| Maximum Operating Frequency | 125 MHz | — |
| Process Technology | 0.42 um CMOS SRAM | 0.42 µm CMOS |
| Core Supply Voltage (VCCINT) | 5 V | — |
| I/O Supply Voltage (VCCIO) | 3.3 V or 5.0 V | — |
| Packhaging | 100-pin TQFP | 100-pin TQFP |
| Uri ng Pagpapasok | Surface Mount | Surface Mount |
| Temperature na Operasyon | 0C to +70C | -40 °C to +85 °C (Industrial) |
| Configuration Memory | SRAM (volatile) | SRAM (volatile, requires external load) |
| Configuration Devices Supported | EPC1, EPC1064, EPC1213, EPC1441 | — |
| In-Circuit Reconfigurability | Yes (ICR) | — |
| Boundary-Scan Support | IEEE 1149.1 JTAG | — |
| Tindminan RoHS | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS status] |
| Logic Elements / Cells | — | 208 |
| Core Supply Voltage | — | 5 V |
| Maximum Toggle Frequency | — | 125 MHz |
| JTAG Boundary Scan | — | Yes (IEEE 1149.1) |
| Lead-Free / Pb-Free | — | [DATA_NEEDED: lead-free status] |
| Speed Grade | — | -3 |