EPF8820ATI144-1 vs EPF8820ATC144-1 Ikinahambing
Detalyadong pagkakahiwalay na pagkakahambing ng EPF8820ATI144-1 sa pamamagitan ng Altera at EPF8820ATC144-1 sa pamamagitan ng Altera. Ikinahambing ang mga pangunahing paglalarawan, mga tama ng elektriko, paakay, kalagayan ng buhay, presyo, at pagkakaroon upang makita ang pinakamahusay na komponente para sa iyong mga kinakailangang pang disenyo.
Altera
EPF8820ATC144-1 - FLEX 8000 FPGA, 672 Cells, 112 I/O, 144-TQFP | Altera
EPF8820ATC144-1 ObsoletePagsanggunian na paghahambing
| Parametro | EPF8820ATI144-1 | EPF8820ATC144-1 |
|---|---|---|
| Brand | Altera | Altera |
| Kategorya | FPGA & CPLD | FPGA & CPLD |
| Katayuan ng Lifecycle | Obsolete | Obsolete |
| Family | FLEX 8000 | FLEX 8000 |
| Device | EPF8820A | EPF8820A |
| Usable Gates | 8,200 | — |
| Logic Elements | 672 | — |
| Total RAM Bits | [DATA_NEEDED: total RAM bits] | — |
| Maximum I/O Pins | 112 | — |
| Dedicated Inputs | 4 | — |
| Packhaging | TQFP-144 (TI144) 0.500 mm pitch | 144-pin TQFP |
| Propagation Delay (tpd) | 1.8 ns | — |
| Maximum Frequency (fmax) | [DATA_NEEDED: fmax MHz] | — |
| Core Supply Voltage (VCCINT) | 3.0 V to 3.6 V | — |
| I/O Supply Voltage (VCCIO) | 3.0 V to 3.6 V (MultiVolt I/O supports 5.0 V) | — |
| Process Technology | 0.42 µm CMOS EPROM | CMOS SRAM |
| Temperature na Operasyon | -40 °C to +85 °C (industrial) | 0C to 70C (commercial) |
| Configuration | SRAM, in-system programmable via EPC configuration controller | — |
| Boundary Scan | IEEE 1149.1 JTAG compliant | — |
| Tindminan RoHS | Unknown | [DATA_NEEDED: RoHS status] |
| Logic Cells | — | 672 |
| Logic Array Blocks (LABs) | — | 84 |
| User I/Os | — | 112 |
| Equivalent Gates | — | ~8,000 usable gates |
| Flip-Flops (max) | — | 1,500 |
| Volte ng Pagbibigay | — | 5.0 V (MultiVolt I/O supports 3.3 V or 5.0 V) |
| Speed Grade | — | -1 (slowest) |
| Configuration Method | — | SRAM, loaded via EPC1 / EPC1064 / EPC1213 / EPC1441 or parallel EPROM |
| In-Circuit Reconfigurability | — | Yes (ICR) |
| JTAG Boundary Scan | — | Yes (IEEE 1149.1) |