MT25QL256BBB8E12-CAUT vs MT25QL128ABB8E12-CAUT Karşılaştırma
Ayrıntılı yan yana karşılaştırma MT25QL256BBB8E12-CAUT tarafından Micron Technology ve MT25QL128ABB8E12-CAUT tarafından Micron TechnologyAnahtar özellikleri, elektriksel parametreleri, ambalajı, yaşam döngüsü durumu, fiyatlandırma ve mevcudiyeti karşılaştırarak tasarım gereksinimleriniz için en iyi bileşeni belirleyin.
Micron Technology
MT25QL256BBB8E12-CAUT - 256Mb SPI Quad I/O NOR Flash | Micron
MT25QL256BBB8E12-CAUT ✓ AktifMicron Technology
MT25QL128ABB8E12-CAUT - 128Mb SPI Quad I/O NOR Flash | Micron
MT25QL128ABB8E12-CAUT ✓ AktifÖzellik Karşılaştırması
| Parametre | MT25QL256BBB8E12-CAUT | MT25QL128ABB8E12-CAUT |
|---|---|---|
| Marka | Micron Technology | Micron Technology |
| Kategori | EEPROM | Memory ICs |
| Yaşam Döngüsü Durumu | Aktif | Aktif |
| Density | 256 Mb (32 MB) | — |
| Bellek Türü | NOR Flash (Serial SPI) | Flash - NOR Memory IC |
| Arayüz | SPI - Multiple I/O (x1/x2/x4 Quad) | SPI - Quad I/O |
| Max Clock Frequency | 133 MHz | 133 MHz |
| Clock Cycle Time | 5 ns | — |
| Besleme Gerilimi | 2.7 V to 3.6 V | 2.7 V to 3.6 V (3V class) |
| İşletim Sıcaklığı | -40C to +125C | -40C to +125C (automotive grade, CAUT suffix) |
| Paket | 24-T-PBGA / TBGA (6x8 mm) | 24-T-PBGA (6x8 mm) |
| FBGA Code | RW346 | — |
| Data Width (Organization) | x1/x2/x4 | — |
| OTP Area | 64-byte dedicated OTP outside main array | — |
| Reset Pin | Available on selected part numbers | — |
| Chipset Validation | N/A | — |
| Product Longevity Program | No | No (per datasheet addendum) |
| Montaj Türü | Surface Mount (BGA) | Surface Mount |
| Automotive Authentication | AUT (authentication suffix per listing) | — |
| Packaging Option | Tray; Tape & Reel for -TR suffix | — |
| Memory Capacity | — | 128 Mbit (16 MB) |
| Access Time | — | 5 ns |
| Memory Organization | — | x1 / x2 / x4 |
| Series | — | MT25Q (successor to N25Q) |
| FBGA Code (family variant) | — | RW314 (MT25QL128ABB1EW7-CAUT per datasheet addendum) |
| Programming/Endurance | — | [DATA_NEEDED: program/erase endurance cycles] |
| Data Retention | — | [DATA_NEEDED: data retention years] |
| Active Read Current | — | [DATA_NEEDED: ICC read current] |
| Standby Current | — | [DATA_NEEDED: ICC standby current] |
| RoHS Durumu | — | [DATA_NEEDED: RoHS compliance statement] |