PK30N512VMD100 vs MK51DN512ZCLQ10 Karşılaştırma
Ayrıntılı yan yana karşılaştırma PK30N512VMD100 tarafından NXP Semiconductors ve MK51DN512ZCLQ10 tarafından NXP SemiconductorsAnahtar özellikleri, elektriksel parametreleri, ambalajı, yaşam döngüsü durumu, fiyatlandırma ve mevcudiyeti karşılaştırarak tasarım gereksinimleriniz için en iyi bileşeni belirleyin.
Özellik Karşılaştırması
| Parametre | PK30N512VMD100 | MK51DN512ZCLQ10 |
|---|---|---|
| Marka | NXP Semiconductors | NXP Semiconductors |
| Kategori | Microcontrollers | Microcontrollers |
| Yaşam Döngüsü Durumu | Obsolete | NRND |
| Product Type | 32-bit ARM Cortex-M4 microcontroller | 32-bit ARM Cortex-M4 microcontroller |
| Series | Kinetis K30 | Kinetis K51 measurement MCU |
| Processor Core | ARM Cortex-M4 | Arm Cortex-M4 |
| Core Width | 32-bit | — |
| Maximum Clock Speed | 100 MHz | 100 MHz |
| Program Memory Size | 512 KB (512K x 8) | — |
| RAM Size | 128K x 8 | — |
| Number of I/O | 102 | — |
| Paket | 144-MAPBGA (13 x 13 mm) | 144-LQFP |
| Package Type | MAPBGA | — |
| Operating Supply Options | 1.8 V, 2.5 V, 3.3 V | — |
| Connectivity | CANbus, EBI/EMI, I2C, IrDA, SD, SPI, UART/USART | — |
| Peripherals | DMA, I2S, LCD, LVD, POR, PWM, WDT | — |
| Oscillator Type | Internal | — |
| Packaging | Tray | — |
| Ambient Temperature Upper Limit | 105 °C | — |
| Yaşam Döngüsü Durumu | Obsolete | NRND |
| Supplier Qualification Note | Pre-qual sample | — |
| RoHS | [DATA_NEEDED: RoHS status] | — |
| REACH | [DATA_NEEDED: REACH status] | — |
| AEC-Q100 Qualification | [DATA_NEEDED: AEC-Q100 qualification] | — |
| Flash Memory | — | 512 KB |
| SRAM | — | 128 KB |
| Operating Voltage | — | 1.71 V to 3.6 V |
| USB Connectivity | — | USB device, host, and OTG |
| Display Support | — | Segment LCD |
| I/O Ports | — | 57 |
| Package Dimensions | — | 20 mm x 20 mm |
| Terminal Count | — | 144 |
| Montaj Türü | — | Surface mount |
| Temperature Grade | — | Industrial |
| Besleme Gerilimi | — | 3.6 V maximum |
| Bellek Türü | — | Flash |
| Application Domain | — | Medical and industrial measurement |