MPX4250DP vs MPX4250A 比較
詳細並排比較 MPX4250DP 由 NXP Semiconductors 與 MPX4250A 由 NXP Semiconductors. 比較關鍵規格、電氣參數、封裝、生命週期狀態、價格與供貨情況，以找出最符合您設計需求的元件。
規格比較
| 參數 | MPX4250DP | MPX4250A |
|---|---|---|
| 品牌 | NXP Semiconductors | NXP Semiconductors |
| 類別 | Pressure Sensors | Pressure Sensors |
| 生命週期狀態 | NRND | NRND |
| Operating Pressure Range | 0 kPa to 250 kPa (0 to 36.3 psi) | 20 to 250 kPa absolute |
| Pressure Type | Differential (dual port) | — |
| 輸出類型 | Analog, ratiometric | Analog, ratiometric to supply voltage |
| 輸出電壓範圍 | 0.2 V to 4.91 V (typical at VS = 5.0 V) | 0.2 V to 4.9 V (at 5.0 V supply) |
| Supply Voltage (VS) | 4.85 V to 5.35 V (typical 5.0 V) | — |
| 供應電流 | [DATA_NEEDED: supply current in mA] | [DATA_NEEDED: supply current at 5 V] |
| Accuracy | ±1.5% (0°C to 85°C) | — |
| 工作溫度 | -40°C to +125°C | -40 C to +125 C |
| Port Configuration | Dual male tube ports, 4.93 mm (0.19 in) diameter | — |
| 封裝 | 6-SIP Module (through-hole) | — |
| 安裝類型 | Through-hole, vertical mount | Through Hole, SIP |
| Response Time | [DATA_NEEDED: response time in ms] | 1.0 ms |
| Pressure Error Band | ±1.5% full-scale span over 0°C to 85°C | — |
| Proof Pressure | [DATA_NEEDED: proof/burst pressure in kPa] | — |
| Burst Pressure | [DATA_NEEDED: burst pressure in kPa] | — |
| Temperature Compensation | On-chip, -40°C to +125°C | — |
| Ratiometricity | Output tracks VS for noise-immune conversion | — |
| RoHS 狀態 | Compliant | Compliant (per NXP product page) |
| Lead-Free | Yes | — |
| 感測器類型 | — | Manifold Absolute Pressure (MAP), sealed vacuum reference |
| Pressure Range | — | 20 kPa to 250 kPa (2.9 PSI to 36.3 PSI) |
| Maximum Overload Pressure | — | [DATA_NEEDED: maximum overload pressure] |
| 供應電壓 | — | 4.85 V to 5.35 V (5.0 V typical) |
| Sensitivity | — | Approx. 18.4 mV/kPa (at Vsup = 5.0 V) |
| Storage Temperature | — | [DATA_NEEDED: storage temperature range] |
| 封裝 / 外殼 | — | 6-SIP Module |
| Port Style | — | No port / non-port (basic element) |
| On-Chip Signal Conditioning | — | Yes (amplified, temperature-compensated, calibrated) |