RTAX2000SL-CQ352V vs RTAX2000D-1CQ352V 比較
詳細並排比較 RTAX2000SL-CQ352V 由 Microchip Technology 與 RTAX2000D-1CQ352V 由 Microchip Technology. 比較關鍵規格、電氣參數、封裝、生命週期狀態、價格與供貨情況，以找出最符合您設計需求的元件。
Microchip Technology
RTAX2000SL-CQ352V - 2M-Gate Rad-Tolerant FPGA | Microchip
RTAX2000SL-CQ352V ✓ 啟用中Microchip Technology
RTAX2000D-1CQ352V - 2M-Gate Rad-Tolerant FPGA | Microchip
RTAX2000D-1CQ352V ✓ 啟用中規格比較
| 參數 | RTAX2000SL-CQ352V | RTAX2000D-1CQ352V |
|---|---|---|
| 品牌 | Microchip Technology | Microchip Technology |
| 類別 | FPGA & CPLD | FPGA & CPLD |
| 生命週期狀態 | 啟用中 | 啟用中 |
| Equivalent System Gates | 2,000,000 | — |
| Logic Elements (CLBs) | 21,504 | — |
| Family | RTAX-S/SL Radiation-Tolerant FPGAs | — |
| Technology | CMOS antifuse (one-time programmable) | Digital CMOS, antifuse (nonvolatile) |
| Configuration | Live at power-up, single chip | Live at power-up, single-chip, no external configuration device |
| 封裝 | CQFP-352 (ceramic quad flat pack) | CQFP-352 (CQ352), ceramic |
| Package Type Code | CQ352 | — |
| Screening / Grade | V (space grade, hermetic) | — |
| Embedded Memory | Embedded SRAM with built-in FIFO control logic | Up to 540 kbits with optional EDAC protection |
| Clock Resources | Segmentable clocks, chip-wide routing | — |
| 工作溫度 | -55C to +125C | [DATA_NEEDED: Operating Temperature] |
| 安裝類型 | Surface Mount | Surface Mount |
| Core Supply Voltage | [DATA_NEEDED: core supply voltage] | 1.425 V to 1.575 V (nominal 1.5 V) |
| Maximum User I/O | [DATA_NEEDED: maximum user I/O count] | — |
| RoHS 狀態 | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS Status] |
| Total Ionizing Dose (TID) Tolerance | [DATA_NEEDED: TID rating] | — |
| Equivalent Gates | — | 2,000,000 |
| Logic Cells | — | 29,568 |
| CLBs | — | 19,712 |
| DSP Mathblocks | — | Up to 120 |
| DSP MAC Performance | — | 125 MHz, 18-bit x 18-bit multiply-accumulate |
| Total Ionizing Dose (Functional) | — | 300 krad (Si) |
| Total Ionizing Dose | — | 200 krad (Si) |
| Speed Grade | — | -1 |
| Screening | — | RTAX-D (Condition A, tighter ICCA limits at 125C final electrical test) |