RTAX4000D-CQ352B vs RTAX2000D-CQ352B 比較
詳細並排比較 RTAX4000D-CQ352B 由 Microchip Technology 與 RTAX2000D-CQ352B 由 Microsemi. 比較關鍵規格、電氣參數、封裝、生命週期狀態、價格與供貨情況，以找出最符合您設計需求的元件。
Microchip Technology
RTAX4000D-CQ352B - 4M-Gate Rad-Tolerant FPGA CQFP-352 | Microchip
RTAX4000D-CQ352B ✓ 啟用中
規格比較
| 參數 | RTAX4000D-CQ352B | RTAX2000D-CQ352B |
|---|---|---|
| 品牌 | Microchip Technology | Microsemi |
| 類別 | FPGA & CPLD | FPGA & CPLD |
| 生命週期狀態 | 啟用中 | 啟用中 |
| Logic Cells | 55,440 | 29568 |
| Configurable Logic Blocks (CLBs) | 36,960 | — |
| Equivalent Gates | 4,000,000 | — |
| System Gates (cells, per Jotrin listing) | 33,600 | — |
| Family | RTAX-DSP (RTAX-S/SL/DSP) | RTAX-S/SL and RTAX-DSP Radiation-Tolerant FPGAs |
| Process Technology | 0.15 um | CMOS antifuse |
| Core Supply Voltage | 1.5 V (1.425 V to 1.575 V) | 1.5 V nominal (1.425 V to 1.575 V) |
| Combinatorial CLB Delay | [DATA_NEEDED: combinatorial CLB delay for standard speed grade; 0.99 ns max is specified for the -1 speed grade variant] | — |
| Technology Type | Antifuse, one-time programmable, radiation-tolerant | — |
| 封裝 | 352-pin Ceramic CQFP (CQFP-352) | CQFP-352 ceramic quad flat pack |
| 安裝類型 | Surface Mount | Surface Mount |
| Configuration | Live at power-up, single chip, no external configuration memory | — |
| Radiation Tolerance | Radiation-tolerant (space-flight qualified family) | Radiation-tolerant (TID/SEE per family datasheet) |
| Application Domain | Space flight systems | Space-flight systems |
| Programmability | OTP (one-time programmable antifuse) | — |
| RoHS 狀態 | [DATA_NEEDED: RoHS status] | [DATA_NEEDED: RoHS Status] |
| 工作溫度 | [DATA_NEEDED: operating temperature range] | [DATA_NEEDED: Operating Temperature Range] |
| Equivalent System Gates | — | 2000000 |
| CLBs | — | 19712 |
| Configuration Type | — | One-time programmable antifuse, live at power-up |
| Embedded Memory | — | Embedded SRAM with built-in FIFO control logic |
| Clocking Features | — | Segmentable clocks, chip-wide highway routing |
| Arithmetic Support | — | Carry logic |
| Screening / Speed Grade | — | B (burn-in screening); D suffix = tighter ICCA limits at 125C final test |
| I/O Supply Voltage | — | [DATA_NEEDED: I/O Bank Supply Voltage] |
| Maximum User I/O | — | [DATA_NEEDED: Maximum User I/O Count] |